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FEI Introduces Three New Transmission Electron Microscopy Systems for Semiconductor and Scientific Research imaging2 Aug 2013Read
Hitachi Launches 3rd Generation Tabletop Microscope imaging28 May 2013Read
PI Launches New Motion-Amplified Piezo Actuator: P-604 PiezoMove® microfluidics, precision positioning, Biotechnology26 Apr 2013Read
JEOL to Present Latest Analysis and Imaging Capabilities at Pittcon 2013 pittcon13 Mar 2013Read
Hitachi Have Electron Microscopes to Suit Everyone at EMC 2012 AMC201210 Aug 2012Read
European Microscopy Congress (emc2012) - Scientific Programme Released Scientific Programme, EMC 201222 Jun 2012Read
High Precision Linear Stage Family Offers Large Variety Biotechnology, aerospace technology, Semiconductor alignment19 Jun 2012Read
A New Dimension in Variable Pressure SEM 3D sample observation, BSE imaging18 Jun 2012Read
Fast Sample Preparation: FIB-SEM with Laser Ablation analytica, FIB-SEM, laser ablation10 Apr 2012Read
FIB-SEM Technology with Laser Ablation for Fast Sample Preparation FIB-SEM, laser ablation, mechanical ablation8 Mar 2012Read

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