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High Throughput Serial Block Face Imaging with JEOL FE SEM and Gatan 3View® 3D imaging11 Dec 2013Read
FEI Introduces the New Tecnai Femto Ultrafast Electron Microscope microscopy30 Oct 2013Read
Leica Microsystems Launches First 3D Surgical Microscopes, Leica M720 OH5 and Leica M525 OH4 with TrueVision 3D Technology Inside 3D imaging, microscopy18 Oct 2013Read
Agar Scientific Expands Filament Production microscopy2 Oct 2013Read
Bruker Introduces Two New Analytical Accessories for Materials Characterization in Electron Microscopes x ray fluorescence6 Aug 2013Read
XEI Scientific Announces the M&M 2013 Launch of Zephyr™ Cleaning Technology with the Evactron® 25Z Decontaminator SEM5 Aug 2013Read
FEI Introduces Three New Transmission Electron Microscopy Systems for Semiconductor and Scientific Research imaging2 Aug 2013Read
Hitachi Launches 3rd Generation Tabletop Microscope imaging28 May 2013Read
PI Launches New Motion-Amplified Piezo Actuator: P-604 PiezoMove® microfluidics, precision positioning, Biotechnology26 Apr 2013Read
JEOL to Present Latest Analysis and Imaging Capabilities at Pittcon 2013 pittcon13 Mar 2013Read

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