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TESCAN ORSAY HOLDING, a.s. and WITec GmbH Launch the RISE Microscope for Correlative Raman-SEM Imaging at analytica 2014 analytica, raman26 Mar 2014Read
New NIST Publication on AFM-IR has Implications for Catalysis Research microscopy, AFM, Nanopores25 Mar 2014Read
Pittcon 2014 Announces Exposition Highlights pittcon13 Feb 2014Read
FEI Introduces the New Tecnai Femto Ultrafast Electron Microscope microscopy30 Oct 2013Read
XEI Scientific Reports on the Patent Awarded for their New Method for Producing Oxygen Radicals for use in the Decontamination of High Vacuum Systems vacuum9 Oct 2013Read
Agar Scientific Expands Filament Production microscopy2 Oct 2013Read
XEI Scientific Announces the M&M 2013 Launch of Zephyr™ Cleaning Technology with the Evactron® 25Z Decontaminator SEM5 Aug 2013Read
FEI Introduces Three New Transmission Electron Microscopy Systems for Semiconductor and Scientific Research imaging2 Aug 2013Read
Hitachi Launches 3rd Generation Tabletop Microscope imaging28 May 2013Read
PI Launches New Motion-Amplified Piezo Actuator: P-604 PiezoMove® microfluidics, precision positioning, Biotechnology26 Apr 2013Read

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