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FEI Introduces the New Tecnai Femto Ultrafast Electron Microscope microscopy30 Oct 2013Read
XEI Scientific Reports on the Patent Awarded for their New Method for Producing Oxygen Radicals for use in the Decontamination of High Vacuum Systems vacuum9 Oct 2013Read
Agar Scientific Expands Filament Production microscopy2 Oct 2013Read
ZEISS Crossbeam Sets New Standards in 3D Nanotomography and Nanofabrication imaging, laser ablation, nanofabrication27 Aug 2013Read
Agar Launches Graphene Oxide Support Films Developed in Collaboration with the University of Warwick thin films, graphene, nanoparticles20 Aug 2013Read
NanoAnalysis goes BIG at M&M 2013 microanalysis9 Aug 2013Read
Advances to the Scanning Electron Microscope ZEISS EVO Presented at Microscopy and Microanalysis 2013 Meeting microanalysis8 Aug 2013Read
JEOL Demonstrates New JEM-1400Plus 120kV Transmission Electron Microscope for High Contrast, CryoTEM, and S/TEM Applications SEM, TEM5 Aug 2013Read
XEI Scientific Announces the M&M 2013 Launch of Zephyr™ Cleaning Technology with the Evactron® 25Z Decontaminator SEM5 Aug 2013Read
FEI Introduces Three New Transmission Electron Microscopy Systems for Semiconductor and Scientific Research imaging2 Aug 2013Read

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