Application Note: Digital Pulsed Force Mode – Thin Layers of Polyvinylalcohol
25 April 2013
For many technical applications, achieving a deeper understanding of the surface structures of thin polymer films on various substrates is an important goal. Atomic Force Microscopy (AFM) is a technique which is perfectly suited to the needs of these studies. In many cases not only the topography, but also material properties of the surface are of great interest. The Digital Pulsed Force Mode provides a convenient way to perform such measurements. This application note describes the analysis of a polyvinylalcohol polymer film using the WITec alpha300 A System under control of the Digital Pulsed Force Mode.