Application Note: Non-Destructive Elemental Impurities Testing for USP 232
26 March 2013

US Pharmacopeial Convention (USP) introduces X-ray Fluorescence (XRF) as an acceptable method for testing compliant with USP chapter 232, the new chapter dealing with heavy metal impurities in pharmaceutical materials. XRF is non-destructive, produces no hazardous waste, has easy sample preparation, long lasting (years) calibrations, and offers low TCO. This white paper describes the technology behind XRF, discusses sample preparation, and demonstrates performance for all USP 232 specified elements.