Application Note: Ellipsometric Characterization of Doped and Undoped Crystalline Diamond Structures
4 March 2013

Diamond is an attractive material for various fields of technology. In addition to reviewing some of the potential applications of diamond, this note, demonstrates how spectroscopic ellipsometry can be used to characterize the optical and structural properties of doped and undoped diamond layers.

Download PDF >>PDF Icon

Read the full article...

  Become a member
  • Quick and complete access to all application articles

  • Download 10,000+
    applications and methods

  • Make informed buying decisions

Already a member?

Log in for full access to the article

Remember me