Application Note: Combined QCM-D/Ellipsometry Setup for Real-Time Characterization of Thin Molecular Films
27 January 2017

Several surface sensitive techniques are able to monitor the formation and properties of thin molecular films on a sensor surface but as the complexity of the studied systems increases, one technique alone can often not provide all desired insight. This application note presents how a combined experimental setup of Quartz Crystal Microbalance with Dissipation Monitoring (QCM-D) and ellipsometry can augment the measurement of molecular behavior at a sensor surface.

Download PDF >>PDF Icon

Read the full article...

  Become a member
  • Quick and complete access to all application articles

  • Download 10,000+
    applications and methods

  • Make informed buying decisions


Already a member?

Log in for full access to the article




Remember me