Application Note: Ultratrace Interference-Free Analysis of Solar-Grade Silicon Wafers by ELAN DRC II ICP-MS
9 August 2010

Lowering the cost of silicon wafers in solar cells can result in more impurities. This application note presents a simple sample-preparation method for the ultratrace interference-free analysis of solar-grade silicon wafers using the ELAN DRC II ICP-MS. This method was shown to obtain accurate, sub-ppb (μg/L) level results quickly.

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