Ultratrace Interference-Free Analysis of Solar-Grade Silicon Wafers by ELAN DRC II ICP-MS
9 Aug 2010

Lowering the cost of silicon wafers in solar cells can result in more impurities. This application note presents a simple sample-preparation method for the ultratrace interference-free analysis of solar-grade silicon wafers using the ELAN DRC II ICP-MS. This method was shown to obtain accurate, sub-ppb (μg/L) level results quickly.

Popular tags in SelectScience

Buying guides

Write a Review

Join the Global SelectScience Community Today! It’s FREE!

Helping you make informed decisions about the latest lab products and technologies:

  • Be the first to learn about new technologies
  • 10,000+ trusted product reviews from your peers
  • Compare 500,000 products and manufacturers
  • Get exclusive buying tips from experts
  • Find solutions fast: 10,000+ Application Notes, Webinars and Videos

Connect with 250,000 scientists... All in one place!

Become a member today!