Application Note: Low Voltage Scanning Electron Microscopy: Promises and Challenges
5 November 2012

High voltage scanning electron microscopy may not be suitable for analyzing non-conducting samples whether they are organic (such as polymers, enzymes, cells, membranes etc) or inorganic (such as ceramics, pigments, minerals, composite materials etc). This application note from Agilent Technologies discusses the limitations of a high voltage electron beam and demonstrates how some of these limitations can be overcome using the Agilent 8500 FE-SEM. Many examples are given and the future applications of the technology are described.

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