Application Note: Novel Optical Design of Field Emission SEMs
21 September 2017

Field emission scanning electron microscopy is standard technology for high resolution imaging and different contrasting methods aiming for a comprehensive characterization of specimens. A wide range of applications is covered by classical FE-SEM technology, including imaging surface sensitive and non-conductive samples without pre-treatment. This application note demonstrates the utility of Zeiss' Gemini technology in advanced imaging applications.