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All-New Benchtop SEM Features EDS Analysis and 60,000X Imaging pittcon, SEM24 Mar 2013Read
JEOL Exhibit New AccuTOF™ GCv 4G Time-of-Flight Mass Spectrometer petroleum analysis, pittcon, food testing24 Mar 2013Read
JEOL to Present Latest Analysis and Imaging Capabilities at Pittcon 2013 pittcon13 Mar 2013Read
High Sensitivity GC-TOF Increases Data Acquisition Speed and Mass Resolving Power GC-TOF7 Aug 2012Read
New Spin on NeoScope Benchtop SEM11 Jul 2012Read
JEOL Announces a New Field Emission Scanning Electron Microscope, JSM-7800F28 Jul 2011Read
New JEOL Large Angle Energy Dispersive Spectrometer (EDS) for Ultrafast Elemental Mapping of S/TEM Samples14 Jul 2011Read
JEOL Unveils New High Throughput, Automated TEM for Nano-analysis12 Jul 2011Read
JEOL Introduces New Environmental Control System for Scientific Instrument Labs1 Jul 2011Read
New JEOL Spinoff Company Dedicated to NMR and ESR Scientific Instrumentation7 Apr 2011Read

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