New ZEN technology for Microscopy
 9 January 2012

Learn about the newly expanded ZEN technology and new Correlative Microscopy in this interview with John B Yorston, Carl Zeiss. Capabilities of the Sigma VP Field Emission Scanning Electron Microscope are demonstrated and the LSM 700 Scanning Confocal Microscope is shown. These systems combine ultra-resolution with labelling capabilities for a turn-key solution called Shuttle and Find. Filmed by SelectScience at ASCB 2011.

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