Atomic Force Microscopy / Scanning Tunneling Microscopy

Atomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.

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WITec GmbH (5)

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Showing 1 - 25 of 64 results

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alpha300 RA Correlative Raman-AFM Microscope

(7)

WITec GmbH



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Scanning Probe Microscope Series WITec alpha300

(1)

WITec GmbH



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alpha300 S Scanning Near-field Optical Microscope

(1)

WITec GmbH



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alpha300 access

(1)

WITec GmbH



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alpha300 A Atomic Force Microscope

WITec GmbH



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Dimension Icon Atomic Force Microscope

(2)

Bruker-Nano



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MultiMode 8-HR

(2)

Bruker-Nano



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Innova-IRIS

(1)

Bruker-Nano



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Dimension Edge™ AFM platform

(1)

Bruker-Nano



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PeakForce QNM

Bruker-Nano



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Dimension FastScan™

Bruker-Nano



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BioScope Catalyst™ BioAFM

Bruker



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Cypher™ AFM

(1)

Asylum Research



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MFP-3D-BIO™

(1)

Asylum Research



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MFP-3D™ Stand Alone AFM

(2)

Asylum Research



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MFP-3D-CF™ AFM

Asylum Research



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ANPx101/RES Positioner

Attocube Sytems, AG



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ANPx101/NUM Positioner

Attocube Sytems, AG



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attoFPSensor

Attocube Sytems, AG



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attoMFM I

Attocube Sytems, AG



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ASC500

Attocube Sytems, AG



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attoSHPM

Attocube Sytems, AG



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attoAFMsolutions

Attocube Sytems, AG



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STEPP Calibration Sample

K-TEK Nanotechnology



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DCP20 Diamond Coated Probe

K-TEK Nanotechnology