ZEISS Crossbeam FIB-SEM by ZEISS Research Microscopy Solutions

Speed up your tomography runs: use up to 100 nA FIB current with excellent spot profile to bridge the gap between micro- and nanopatterning. With Crossbeam you combine the imaging and analytical performance of the GEMINI column with the ability of a next-generation FIB for material processing and sample preparation on a nanoscopic scale. Use the modular platform concept and the open and easily extendable software architecture of this 3D nano-workstation for high throughput nanotomography and na... Read more


ZEISS Crossbeam FIB-SEM by ZEISS Research Microscopy Solutions product image
ZEISS Crossbeam FIB-SEM


0 Scientists have reviewed this product


Write the First Review

No Reviews

Speed up your tomography runs: use up to 100 nA FIB current with excellent spot profile to bridge the gap between micro- and nanopatterning.

With Crossbeam you combine the imaging and analytical performance of the GEMINI column with the ability of a next-generation FIB for material processing and sample preparation on a nanoscopic scale. Use the modular platform concept and the open and easily extendable software architecture of this 3D nano-workstation for high throughput nanotomography and nanofabrication of even your most demanding, charging or magnetic samples.


Features & Benefits:

  • Speed up your nanotomography and nanofabrication: combine low kV SEM performance with FIB currents up to 100 nA.
  • Gain maximum information: use multi-detector acquisition and the ability to mill and image simultaneously.
  • Examine large fields of view of up to 50 k x 40 k pixels - thanks to GEMINI technology and the optional ATLAS 3D package.
  • Profit from maximum stability and a uniform beam profile during your demanding long-term experiments.
  • Change system parameters such as probe current or acceleration voltage in real time during your acquisition, without image adjustments.
  • Enjoy the easy-to-understand graphical user interface.
  • Easily upgrade your Crossbeam with a wide range of detectors and accessories.
  • Customize your system for in situ experiments.
  • With the open application programming interface (API) you have access to every microscope parameter.