SMZ1270 / SMZ1270i by Nikon Europe BV

Manufacturer Nikon Europe BV  |  Available Worldwide
The SMZ1270/1270i offers the highest-in-class zoom ratio of 12.7x (0.63 - 8x). Wide viewfield at low magnification enables easy confirmation of observation targets, providing bright and sharp images through the entire viewfield. The SMZ1270i is also equipped with intelligent functions that enable automatic detection of magnification data. Key features The highest-in-class zoom ratio of 12.7x (0.63 - 8x) offers both low-magnification wide viewfield observation of the whole of a 35 mm pet... Read more


SMZ1270 / SMZ1270i by Nikon Europe BV product image
SMZ1270 / SMZ1270i
Request Pricing

Receive your quote directly from the manufacturer.



0 Scientists have reviewed this product


Write the First Review

No Reviews

The SMZ1270/1270i offers the highest-in-class zoom ratio of 12.7x (0.63 - 8x). Wide viewfield at low magnification enables easy confirmation of observation targets, providing bright and sharp images through the entire viewfield. The SMZ1270i is also equipped with intelligent functions that enable automatic detection of magnification data.

Key features

  • The highest-in-class zoom ratio of 12.7x (0.63 - 8x) offers both low-magnification wide viewfield observation of the whole of a 35 mm petri dish during screening and high-magnification observation of minute cell structures
  • Apochromat optics have been adopted for the lenses in the SMZ1270/1270i zoom body to achieve high-level chromatic aberration correction, providing sharp images without blur or colour fringe
  • The newly developed WF series objectives offer uniformly bright images even at low magnification and wide viewfield observation, in addition a 0.75x objective is now available
  • In combination with the DS-L4 Unit and NIS-Elements software, the SMZ1270i can detect zoom magnification data, and with the Intelligent Nosepiece P-RNI2 attached, data related to the objective in use is also detected
  • The double nosepiece offers easy on-axis imaging, enabling observation of the bottom of holes, accurate simple measurement and extended depth-of-focus (EDF) imaging without distortion
  • Eyepiece tubes with a range of inclination angles are available for comfortable observation. The slim type plain stands and the LED Diascopic Illumination Stand easily facilitate the presentation and removal of specimens
  • The same high level of accessories used with superior models are also available for these models, allowing various microscope configurations to suit numerous routine inspections and a range of research and development applications
  • OCC illumination boosts the contrast of transparent sample structures