Park NX7 by Park Systems
Manufacturer Park Systems | Available Worldwide
The most affordable research grade Atomic Force Microscope with flexible sample handling
Park NX7
Park XE7 provides accurate measurement at high nanoscale resolution. It allows to obtain sample nanoscale images thanks to its flat, orthogonal, and linear scan measurements by its unique AFM architecture: independent XY and Z, flexure-based scans. Furthermore, Park's unique True Non-Contact™ mode provides you with the sharpest images, scan after scan without declining resolution. With its key ease-of-use features, the NX7 allows you to do precise research within your budget.
Key Features:
- Unmatched data accuracy in nano resolution improved with NX AFM Head
- Flexible sample handling and easy tip exchange
- Comprehensive range of SPM modes incl. advanced nanomechanical measurement modes as default
- True Non-Contact™ Mode preventing destructive tip-sample interaction during scanning
Product Overview
