Park XE7 provides accurate measurement at high nanoscale resolution. It allows to obtain sample nanoscale images thanks to its flat, orthogonal, and linear scan measurements by its unique AFM architecture: independent XY and Z, flexure-based scans. Furthermore, Park's unique True Non-Contact™ mode provides you with the sharpest images, scan after scan without declining resolution.
XE7 allows to integrate wide range of measuring modes and to combine accessories to tailor it to your unique research requirements. Pre-aligned tip mount, easy sample and tip exchange as well as automated SmartScan™ operating software make XE7 being extreme easy to use and of high productivity, even for novice users.
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