Park NX7 by Park Systems

Manufacturer Park Systems  |  Available Worldwide
The most affordable research grade Atomic Force Microscope with flexible sample handling


Park NX7 by Park Systems product image
Park NX7
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Park XE7 provides accurate measurement at high nanoscale resolution. It allows to obtain sample nanoscale images thanks to its flat, orthogonal, and linear scan measurements by its unique AFM architecture: independent XY and Z, flexure-based scans. Furthermore, Park's unique True Non-Contact™ mode provides you with the sharpest images, scan after scan without declining resolution. With its key ease-of-use features, the NX7 allows you to do precise research within your budget.

Key Features:

  • Unmatched data accuracy in nano resolution improved with NX AFM Head
  • Flexible sample handling and easy tip exchange
  • Comprehensive range of SPM modes incl. advanced nanomechanical measurement modes as default
  • True Non-Contact™ Mode preventing destructive tip-sample interaction during scanning

Product Overview

Park NX7 by Park Systems product image

Park NX7

Manufacturer Park Systems  |  Available Worldwide

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