Park XE7 provides accurate measurement at high nanoscale resolution. It allows to obtain sample nanoscale images thanks to its flat, orthogonal, and linear scan measurements by its unique AFM architecture: independent XY and Z, flexure-based scans. Furthermore, Park's unique True Non-Contact™ mode provides you with the sharpest images, scan after scan without declining resolution. With its key ease-of-use features, the NX7 allows you to do precise research within your budget.
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