Park XE7 by Park Systems
Manufacturer Park Systems | Available Worldwide
The most affordable research Atomic Force Microscope with flexible sample handling
Park XE7
Park XE7 provides accurate measurement at high nanoscale resolution. It allows to obtain sample nanoscale images thanks to its flat, orthogonal, and linear scan measurements by its unique AFM architecture: independent XY and Z, flexure-based scans. Furthermore, Park's unique True Non-Contact™ mode provides you with the sharpest images, scan after scan without declining resolution.
XE7 allows to integrate wide range of measuring modes and to combine accessories to tailor it to your unique research requirements. Pre-aligned tip mount, easy sample and tip exchange as well as automated SmartScan™ operating software make XE7 being extreme easy to use and of high productivity, even for novice users.
Key Technical Features:
- Decoupled XY and Z Scanners
- Flat Orthogonal XY Scanning Without Scanner Bow
- Accurate Feedback by Faster Z-servo enables True Non-Contact AFM
- 2D Flexure-Guided Scanner with 10 µm x 10 µm Scan Range
- Flexure-Guided High Force Z Scanner
- Slide-to-Connect SLD Head
- Accessible Sample Holder
- Manual XY Sample Stage
- Manual Optics Stage
Product Overview
