Latest: Nominations are open! Nominate your favorite new lab product of 2019 for a Scientists’...
Latest: Join SelectScience at Lab Innovations 2019 to celebrate the lab technologies scientists...
Latest: How GSK’s Method Innovation team is leading new efficiencies in biopharmaceutical...
Latest: Unlocking the secrets to faster analytical methods in food quality and safety testing
Latest: KNAUER joins industrial sustainability research project
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Latest: Improving energy storage: What makes the perfect battery?
Ultra-high-throughput screening (uHTS): How scientists at Scripps Research target global medical...
Nominations are open! Nominate your favorite new lab product of 2019 for a Scientists’ Choice Award
FUJIFILM Irvine Scientific launches BalanCD Gal Supplement for biotherapeutic development
Roche presents new OCREVUS (ocrelizumab) biomarker data that increase understanding of disease...
How to enhance your sample prep and chromatography for environmental contaminant analysis
How to ensure you never miss a critical biological event with improved whole-well imaging
Ten Applications of Live-Cell Analysis in Immunology
Introduction to the AQS<sup>3</sup>™ pro and Microfluidic Modulation Spectroscopy
High-throughput, three-dimensional assay development
AttractSPE™ Disks for analysis of perfluorinated compounds in large volumes of water
Structural insights with cryo-EM
Cultivating Consistency: Tips and Tricks for Successful Cell Cultures
Cell Imaging Technology
CAR-T Cell Therapy Workflows
Hematology Analyzers & Stainers
30 Oct 19 - 31 Oct 19
ELRIG Drug Discovery 2019
05 Nov 19 - 06 Nov 19
25 Jan 20 - 29 Jan 20
01 Mar 20 - 04 Mar 20
01 Mar 20 - 05 Mar 20
MultiMode 8 Scanning Probe Microscope from Veeco Instruments The World's Highest Resolution, Most Published SPM Just Got Better The MultiMode® 8 Scanning Probe Microscope (SPM) resets the standard for high-performance SPMs. A... Read more...
We are offering for sale a Veeco Dektak V200SL Profiler. - Setup for 6" and 8" wafers - Stylus-based measurement technology provides step height repeatability for monitoring the uniformity of etch and deposition processes. - SECS/GEM c... Read more...
Silicon nitride probes for contact, fluid tapping mode and force measurement, with a variety of extremely low spring constants for high force sensitivity. Sharpened; 6 cantilevers 0.01-0.50N/m; Au Reflective Coating.
Tip Specification ... Read more...
The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and other thin/thick films. The system provides 7.5 an... Read more...
The Dimension® Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance, representing a new level of productivity and attainability for the most advanced nanoscale research. It leverages the many innovati... Read more...
Lowest noise, highest resolution Atomic Force Microscope in its class The Innova atomic force microscope provides more performance and flexibility at a greater value than any other SPM. The proprietary closed-loop scan delivers noise-leve... Read more...