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Latest: Special Feature: 5 Technologies Advancing the Development of Engineered Antibodies
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Special Feature: 5 Technologies Advancing the Development of Engineered Antibodies
Developing Biosensors to Tackle the Scourge of Ciguatera-Contaminated Fish in Tahiti & Beyond
Fast High-Throughput Protein Purification
Keynote Speakers Announced for Lab Innovations 2019
3D Tumor Modeling: Latest Solutions for Single and Multi-Spheroid Culture & Analysis
Liquid Handling Automation – Simplify Complex Protocols Without Compromising on Your Results
Oligo Pools: Design. Build. Test.
Scale-Up of an Analytical HPLC Method for Steviol Glycosides to a Preparative Approach
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Pathway Engineering Through 5 kb Gene Synthesis
Quantification of Steviol Glycosides in Stevia Samples with RP-HPLC
Monoclonal Antibody Workflows on the Shimadzu Q-TOF LCMS-9030 Using the Protein Metrics Software...
Hematology Analyzers & Stainers
Clinical Chemistry Analyzers
Flow Cytometry for Screening
Pre-Clinical and Clinical Lab Automation
SLAS Europe 2019 Conference...
26 Jun 19 - 28 Jun 19
04 Aug 19 - 08 Aug 19
30 Oct 19 - 31 Oct 19
ELRIG Drug Discovery 2019
05 Nov 19 - 06 Nov 19
25 Jan 20 - 29 Jan 20
MultiMode 8 Scanning Probe Microscope from Veeco Instruments The World's Highest Resolution, Most Published SPM Just Got Better The MultiMode® 8 Scanning Probe Microscope (SPM) resets the standard for high-performance SPMs. A... Read more...
We are offering for sale a Veeco Dektak V200SL Profiler. - Setup for 6" and 8" wafers - Stylus-based measurement technology provides step height repeatability for monitoring the uniformity of etch and deposition processes. - SECS/GEM c... Read more...
Silicon nitride probes for contact, fluid tapping mode and force measurement, with a variety of extremely low spring constants for high force sensitivity. Sharpened; 6 cantilevers 0.01-0.50N/m; Au Reflective Coating.
Tip Specification ... Read more...
The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and other thin/thick films. The system provides 7.5 an... Read more...
The Dimension® Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance, representing a new level of productivity and attainability for the most advanced nanoscale research. It leverages the many innovati... Read more...
Lowest noise, highest resolution Atomic Force Microscope in its class The Innova atomic force microscope provides more performance and flexibility at a greater value than any other SPM. The proprietary closed-loop scan delivers noise-leve... Read more...