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MultiMode 8 Scanning Probe Microscope from Veeco Instruments The World's Highest Resolution, Most Published SPM Just Got Better The MultiMode® 8 Scanning Probe Microscope (SPM) resets the standard for high-performance SPMs. A... Read more...
We are offering for sale a Veeco Dektak V200SL Profiler. - Setup for 6" and 8" wafers - Stylus-based measurement technology provides step height repeatability for monitoring the uniformity of etch and deposition processes. - SECS/GEM c... Read more...
Silicon nitride probes for contact, fluid tapping mode and force measurement, with a variety of extremely low spring constants for high force sensitivity. Sharpened; 6 cantilevers 0.01-0.50N/m; Au Reflective Coating.
Tip Specification ... Read more...
The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and other thin/thick films. The system provides 7.5 an... Read more...
The Dimension® Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance, representing a new level of productivity and attainability for the most advanced nanoscale research. It leverages the many innovati... Read more...
Lowest noise, highest resolution Atomic Force Microscope in its class The Innova atomic force microscope provides more performance and flexibility at a greater value than any other SPM. The proprietary closed-loop scan delivers noise-leve... Read more...