Product Brochure: ZEISS integrated atomic force microscope: Your only true in situ AFM solution for FE-SEMs and FIB-SEMs

16 November 2020

This product brochure describes the features of the ZEISS integrated atomic force microscope - a combination of atomic force microscopy (AFM) with your ZEISS scanning electron microscope (SEM) or focused ion beam-SEM (FIB-SEM).

Download PDF >>