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Akemi Nogiwa Valdez




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    Inspect™ - Scanning Electron Microscope
    "Very easy to use interface that makes analysis time shorter than with other equipment. Good resolution at SkeV for fine grain size microstructures. Large entry chamber gives flexibility for wide range of sample sizes."

    Application area: Materials science

    5 November 2012
    • Ease of use5 out of 5
    • After sales service4 out of 5
    • Value for money4 out of 5
    Average    

    4 out of 5



     

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