Quanta™ - Scanning Electron Microscope
"The Quanta 3D SEM is a really easy to use dual beam SEM/FIB with excellent ion beam machining capabilities. Beam currents available up to 20nA and quick selection between lower ion currents. The software provided is simple to understand and follow with little room to make error or do anything you should be able to do.
The system we have does unfortunately only have a tungsten filament on the SEM which does not perform well and lets the overall system down greatly considering how well the FIB column performs.
Sample quality for thin TEM lamella are very good and with lower ion currents can reduce the sample damage."
Application area: TEM Sample Preparation
18 September 2012
- Ease of use
- After sales service
- Value for money