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Anasys Reports on University of Illinois Study of Near-Field Behavior of Semiconductor Plasmonic Microparticles using AFM-IR Published in APL surface plasmon resonance, semiconductors, AFM15 May 2013Read
Bruker Expands PeakForce Tapping Accessibility New Dimension Edge AFM Available with ScanAsyst AFM3 May 2013Read
Anasys Instruments Reports on University of Illinois Publication on Nanoscale Chemical Analysis using AFM-IR chemical process analysis, AFM, polymers1 May 2013Read
Imec Confirms Bruker’s New Dimension Icon® SSRM-HR Atomic Force Microscope Configuration Offers Highest Resolution Carrier Profiling Capability AFM22 Apr 2013Read
JPK Reports on the Research Activities of the Nanophysics Group at the Istituto Italiano di Tecnologia Based in Genova fluorescence microscopy, confocal, AFM16 Apr 2013Read
WITec Announce Winners of the PaperAward 2013 live cell imaging, semiconductors, AFM9 Apr 2013Read
Anasys Introduce New Lorentz Contact Resonance Imaging Mode for their afm+ and nanoIR Systems AFM, Nanotechnology, polymers26 Mar 2013Read
WITec Launches StrobeLock for Time-Resolved Measurements at Pittcon 2013 fluorescence microscopy, time resolved photoluminescence18 Mar 2013Read
JPK Reports on the Applied Research of Ioan Notingher at the University of Nottingham using AFM and the Tip Assisted Optics Module to Study Individual Nanotubes and Fibrils molecular biology, nanotubes, neurobiology27 Feb 2013Read
Anasys to Discuss Major Improvements to its AFM-IR Nanoscale Spectroscopy Product Family at Pittcon 2013 polymeric materials, pittcon, Nanotechnology5 Feb 2013Read

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