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NT-MDT Launches Titanium, the First AFM with Automated, Multiple Tip Exchange AFM28 Mar 2014Read
Pittcon 2014 Announces Exposition Highlights pittcon13 Feb 2014Read
SelectScience Opens Voting in the Scientists’ Choice Awards for Best New General Lab Product, Best New Separations Product and Best New Spectroscopy Product of the Year 2013 scientists choice awards31 Jan 2014Read
SelectScience Opens Nominations for the 2013 Scientists’ Choice Awards scientists choice awards9 Jan 2014Read
JPK Launches Fast-Scanning & Super-Resolution NanoWizard ULTRA Speed AFM System AFM11 Dec 2013Read
JPK Reports on the Studies of the Nanomechanical Properties of Biomaterials at Nagoya Institute of Technology in Japan protein analysis, AFM3 Sep 2013Read
Agilent Technologies Furthers Investigative Potential of Scanning Microwave Microscopy via Enhanced EMPro Software AFM16 Aug 2013Read
HORIBA Scientific Announce Agreement to Distribute AIST-NT Scanning Probe Microscopes raman14 Aug 2013Read
Bruker Expands PeakForce Tapping Accessibility New Dimension Edge AFM Available with ScanAsyst AFM3 May 2013Read
Anasys Instruments Reports on University of Illinois Publication on Nanoscale Chemical Analysis using AFM-IR chemical process analysis, AFM, polymers1 May 2013Read

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