AFM / STM Accessories

Attocube attoFPSensor - Long range, high precision, ultra compact interferometric displacement sensor The attoFPSensor is based on a Fabry Perot interferometer consisting of a single mode fiber and a sensing element. The compact desig... Read more...

Attocube ASC500 - Scanning Probe Microscope Controller The Attocube Systems ASC500 is a modular and flexible digital SPM controller which combines state-of-the-art hardware with innovative software architecture, offering superior perfo... Read more...

Attocube Systems ANPx101/RES The ANPx101/RES linear, horizontal stepper positioner with resistive position readout allows for absolute positioning control. This readout solution can be delivered compatible with low temperatures, ultra... Read more...

Attocube Systems ANPx101/NUM Positioner The ANPx101/NUM Positioner with an optoelectronic encoder allows for ultra precise, closed loop positioning control. This readout solution can be delivered compatible with ultra high vacuum. ... Read more...

K-TEK Nano Grating set TGS1 consists of 3 calibration gratings: TGZ1, TGZ2, TGZ3 TGZ series is intended for Z-axis calibration of scanning probe microscopes (SPM) and non-linearity measurements. Each grating offers a different step hei... Read more...

Grating set TGS2 consists of 6 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1 Fields of application for the TGS2 Calibration Grating Set: - Lateral and vertical calibration - Detection of lateral non-linearity - Detection... Read more...

Grating set K-TEK Nano TGSFull consists of 8 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1, TGQ1, TDG1 Fields of application for the TGSFull Calibration Grating Set: - SPM simultaneous calibration of X, Y, and Z directions... Read more...

K-TEK DNA Test Sample DNA01 is Plasmid pGem7zf+ (Promega), which is linearized with the SmaI endonuclease. Linear DNA molecules (3000 b. p.) are deposited at the freshly cleaved mica. Molecules are uniformly distributed over the surfac... Read more...

STEPP calibration sample from K-TEK Nano The Silicon Test Echeloned Pattern STEPP for AFM is designed on the base of silicon (111) surface with verified distribution of monoatomic steps as main calibrating inits for the complex contr... Read more...

K-TEK Nano HOPG Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM HOPG piece has a top w... Read more...

HOPG from K-TEK Nanotechnology Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM HOPG piece... Read more...

HOPG from K-TEK Nanotechnology Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM Read more...

HOPG from K-TEK Nanotechnology Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM Read more...

HOPG from K-TEK Nanotechnology -HOPG ZYH Quality - Mosaic Spread: 3.5 - 5 degrees Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of... Read more...