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First International Symposium on Advanced Photonics Held in Hamamatsu City, Japan
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10 May 2016-13 May 2016
63rd ASMS Conference
05 Jun 2016-09 Jun 2016
19 Jun 2016-24 Jun 2016
AACC (American Association fo...
31 Jul 2016-04 Aug 2016
18 Oct 2016-22 Oct 2016
ICnano® provides a simple, robust and reliable system for scanning ion conductance microscopy (SICM) - the ideal technique for high resolution imagin... Read more...
MultiMode 8 Scanning Probe Microscope from Veeco Instruments The World's Highest Resolution, Most Published SPM Just Got Better The Mul... Read more...
Lowest noise, highest resolution Atomic Force Microscope in its class The Innova atomic force microscope provides more performance and flexibility a... Read more...
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