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AACR Annual Meeting 2017
01 Apr 2017-05 Apr 2017
65th ASMS Conference
04 Jun 2017-08 Jun 2017
30 Jul 2017-03 Aug 2017
K-TEK Nano Grating set TGS1 consists of 3 calibration gratings: TGZ1, TGZ2, TGZ3 TGZ series is intended for Z-axis calibration of scanning probe ... Read more...
Grating set TGS2 consists of 6 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1 Fields of application for the TGS2 Calibration Grating Se... Read more...
Grating set K-TEK Nano TGSFull consists of 8 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1, TGQ1, TDG1 Fields of application for the T... Read more...
STEPP calibration sample from K-TEK Nano
The Silicon Test Echeloned Pattern STEPP for AFM is designed on the base of silicon (111) surface with... Read more...