SPM / AFM

Scanning Probe Microscopy is a technique used to produce images of surfaces using mechanical probes. Types of SPM include atomic force microscopy (AFM), scanning tunneling microscopy (STM) and near field scanning optical microscopy (NSOM). There are many different types of probe / cantilever available for SPM including coated probes, diamond probes and magnetic probes.
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LSM 800 for Materials

(1)

ZEISS Microscopy



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ZEISS ORION NanoFab

ZEISS Microscopy



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PeakForce QNM

Bruker Daltonics



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alpha300 S Scanning Near-field Optical Microscope

(1)

WITec GmbH



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alpha300 A Atomic Force Microscope

WITec GmbH



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Scanning Probe Microscope Series WITec alpha300

WITec GmbH



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alpha300 access

WITec GmbH



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alpha300 RA Correlative Raman-AFM Microscope

WITec GmbH



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LUMOS FTIR Fully Automated Stand-Alone Microscope

Bruker Optik GmbH



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Innova-IRIS

(1)

Bruker-Nano



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Dimension Edge™ AFM platform

(1)

Bruker-Nano



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Dimension FastScan™

Bruker-Nano



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Dimension Icon Atomic Force Microscope

Bruker-Nano



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BioScope Catalyst™ BioAFM

Bruker



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Cypher™ AFM

(1)

Asylum Research



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MFP-3D-BIO™

(1)

Asylum Research



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MFP-3D™ Stand Alone AFM

(2)

Asylum Research



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MFP-3D-CF™ AFM

Asylum Research



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attoMFM I

Attocube Sytems, AG



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attoAFMsolutions

Attocube Sytems, AG



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attoSHPM

Attocube Sytems, AG



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ASC500

Attocube Sytems, AG



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attoFPSensor

Attocube Sytems, AG



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ANPx101/RES Positioner

Attocube Sytems, AG



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ANPx101/NUM Positioner

Attocube Sytems, AG