Scanning Probe Microscopy / Atomic Force Microscopy (SPM / AFM)

Scanning Probe Microscopy is a technique used to produce images of surfaces using mechanical probes. Types of SPM include atomic force microscopy (AFM), scanning tunneling microscopy (STM) and near field scanning optical microscopy (NSOM). There are many different types of probe / cantilever available for SPM including coated probes, diamond probes and magnetic probes.

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