SPM-AFM
Scanning Probe Microscopy is a technique used to produce images of surfaces using mechanical probes. Types of SPM include atomic force microscopy (AFM), scanning tunneling microscopy (STM) and near field scanning optical microscopy (NSOM). There are many different types of probe/cantilever available for SPM including coated probes, diamond probes and magnetic probes. Learn about the latest products, user reviews, applications, news, videos and webinars.
Product Reviews
Peter Eaton
Membership StatusSelectScience Members can achieve membership status by writing product reviews. This helps other members to better understand the Reviewer’s experience and expertise.
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| Member | 0 |
Reviewer![]() | 1-4 |
Advanced Reviewer![]() | 5-14 |
Expert Reviewer![]() ![]() | 15+ |
| Review Panel Member | By Invitation |
Reviewers are also encouraged to publish a ‘public profile’ so others can benefit from a further understanding of the Reviewer’s applications and expertise.
Write a review today >>, Faculdade de Ciências da Universidade do Porto
Andrew Stannard
Membership StatusSelectScience Members can achieve membership status by writing product reviews. This helps other members to better understand the Reviewer’s experience and expertise.
| Status: | No. Reviews Published: |
| Member | 0 |
Reviewer![]() | 1-4 |
Advanced Reviewer![]() | 5-14 |
Expert Reviewer![]() ![]() | 15+ |
| Review Panel Member | By Invitation |
Reviewers are also encouraged to publish a ‘public profile’ so others can benefit from a further understanding of the Reviewer’s applications and expertise.
Write a review today >>, UNIVERSITY OF NOTTINGHAM
Yi Zhou
Membership StatusSelectScience Members can achieve membership status by writing product reviews. This helps other members to better understand the Reviewer’s experience and expertise.
| Status: | No. Reviews Published: |
| Member | 0 |
Reviewer![]() | 1-4 |
Advanced Reviewer![]() | 5-14 |
Expert Reviewer![]() ![]() | 15+ |
| Review Panel Member | By Invitation |
Reviewers are also encouraged to publish a ‘public profile’ so others can benefit from a further understanding of the Reviewer’s applications and expertise.
Write a review today >>, Indiana University--Bloomington
Latest news
News
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Anasys Reports on University of Illinois Study of Near-Field Behavior of Semiconductor Plasmonic Microparticles using AFM-IR Published in APL
15 May 2013
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Bruker Expands PeakForce Tapping Accessibility New Dimension Edge AFM Available with ScanAsyst
03 May 2013
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Anasys Instruments Reports on University of Illinois Publication on Nanoscale Chemical Analysis using AFM-IR
01 May 2013
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Imec Confirms Bruker’s New Dimension Icon® SSRM-HR Atomic Force Microscope Configuration Offers Highest Resolution Carrier Profiling Capability
22 Apr 2013
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JPK Reports on the Research Activities of the Nanophysics Group at the Istituto Italiano di Tecnologia Based in Genova
16 Apr 2013
Application articles
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Digital Pulsed Force Mode – Polymer Differentiation
WITec GmbH26 Apr 2013
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Digital Pulsed Force Mode - Adhesion and Separation Mode
WITec GmbH25 Apr 2013
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Digital Pulsed Force Mode – Thin Layers of Polyvinylalcohol
WITec GmbH25 Apr 2013
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Imaging of a Diamond Film, Carbon Nanotubes and Graphene with Confocal Raman and Atomic Force Microscopy
WITec GmbH05 Mar 2013
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Quantitative Mechanical Property Mapping at the Nanoscale with PeakForce QNM
Bruker Daltonics04 Mar 2013
Featured products
LUMOS is a fully automated stand-alone FT-IR microscope. It combines best performance for visual inspection and infrared spectral analysis of micro s...
More about the NEW LUMOS FT-IR Fully Automated Stand-Alone Microscope
Automated Confocal Raman and/or Atomic Force Microscope alpha500 - Automated Imaging System for Analyzing Chemical and Surface Structural Properties...
More about the Confocal Raman and Atomic Force Microscope alpha500
Automated Confocal Raman and/or Atomic Force Microscope alpha500 - Automated Imaging System for Analyzing Chemical and Surface Structural Properties...
More about the Confocal Raman and Atomic Force Microscope alpha500











