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Attocube attoFPSensor - Long range, high precision, ultra compact interferometric displacement sensor
The attoFPSensor is based on a Fabry Perot... Read more...
Attocube ASC500 - Scanning Probe Microscope Controller The Attocube Systems ASC500 is a modular and flexible digital SPM controller which combine... Read more...
Attocube Systems ANPx101/RES
The ANPx101/RES linear, horizontal stepper positioner with resistive position readout allows for absolute positioni... Read more...
Attocube Systems ANPx101/NUM Positioner The ANPx101/NUM Positioner with an optoelectronic encoder allows for ultra precise, closed loop position... Read more...
K-TEK Nano Grating set TGS1 consists of 3 calibration gratings: TGZ1, TGZ2, TGZ3 TGZ series is intended for Z-axis calibration of scanning probe ... Read more...
Grating set TGS2 consists of 6 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1 Fields of application for the TGS2 Calibration Grating Se... Read more...
Grating set K-TEK Nano TGSFull consists of 8 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1, TGQ1, TDG1 Fields of application for the T... Read more...
K-TEK DNA Test Sample DNA01 is Plasmid pGem7zf+ (Promega), which is linearized with the SmaI endonuclease. Linear DNA molecules (3000 b. p.) are ... Read more...
STEPP calibration sample from K-TEK Nano
The Silicon Test Echeloned Pattern STEPP for AFM is designed on the base of silicon (111) surface with... Read more...
K-TEK Nano HOPG
Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smoot... Read more...
HOPG from K-TEK Nanotechnology Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution -... Read more...
HOPG from K-TEK Nanotechnology -HOPG ZYH Quality - Mosaic Spread: 3.5 - 5 degrees Highly oriented pyrolitic graphite (HOPG) allows users to obtain... Read more...