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Atomic Force Microscopy (AFM) Microscopes/Systems (20)

Automated Microscopes/Systems (4)

Combined AFM Microscopes/Systems (5)

Environmental Control Microscopes/Systems (1)

Magnetic Force Microscopy (MFM) Microscopes/Systems (2)

Multimode Microscopes/Systems (1)

Near-field Scanning Optical Microscopy (NSOM /SNOM) Microscopes/Systems (2)

Scanning Hall Probe Microscopes (SHPM)/Systems (1)

Scanning Probe Microscopes (SPM)/Systems (5)

SPM/AFM Accessories (26)

SPM/AFM Cantilevers / Levers (20)

SPM/AFM Positioners / Nanopositioners (3)

SPM/AFM Probes (23)

SPM/AFM Software (1)

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HOPG: GRBS/1.7
K-TEK Nanotechnology

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HOPG from K-TEK Nanotechnology Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of...
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HOPG: GRBS/2.0
K-TEK Nanotechnology

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HOPG from K-TEK Nanotechnology -HOPG ZYH Quality - Mosaic Spread: 3.5 - 5 degrees Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic...
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NSG01 AFM Mode Non-Contact Probe
K-TEK Nanotechnology

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K-TEK Nanotechnology NSG01 - AFM Mode: Non Contact, Semi Contact Probe This versatile AFM-mode non-contact probe from K-TEK Nano provides its users with a tetrahedral tip design which...
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NSG01 DLC AFM Mode Non-Contact Probe
K-TEK Nanotechnology

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K-TEK Nano NSG01 DLC - AFM Non-Contact Diamond-Like Carbon (DLC) Probe Super sharp diamond-like carbon (DLC) tips with typical curvature radius of 1nm are extremely useful for...
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NSG03 AFM Mode Non-Contact Probe
K-TEK Nanotechnology

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K-TEK Nano NSG03 AFM Mode: Non Contact, Semi Contact Probe This versatile AFM mode non-contact probe provides its users with a tetrahedral tip design which allows for greater...
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NSG10 AFM Mode Non-Contact Probe
K-TEK Nanotechnology

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K-TEK NSG10 AFM Mode: Non Contact, Semi Contact Probe This versatile non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of...
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NSG10 DLC AFM Mode Non-Contact Probe
K-TEK Nanotechnology

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K-TEK NSG10 - Diamond Like Carbon DLC AFM Non Contact Probes Super sharp NSG10 diamond-like carbon(DLC) AFM tips with typical curvature radius of 1nm are extremely useful for...
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NSG20 AFM Mode Non-Contact Probe
K-TEK Nanotechnology

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K-TEK Nano NSG20 - AFM Mode Non-Contact Probe This versatile NSG20 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms...
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NSG30 AFM Mode Non-Contact Probe
K-TEK Nanotechnology

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K-TEK NSG30 - AFM Mode Non-Contact, Semi Contact Probe This versatile NSG30 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency...
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STEPP Calibration Sample
K-TEK Nanotechnology

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STEPP calibration sample from K-TEK Nano The Silicon Test Echeloned Pattern STEPP for AFM is designed on the base of silicon (111) surface with verified distribution of monoatomic...
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TETRA 14 Non-Contact AFM Probe
K-TEK Nanotechnology

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TETRA 14 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 14 non-contact AFM probe design allows for the optical viewing of the tip as it engages the...
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TETRA 15 Non-Contact AFM Probe
K-TEK Nanotechnology

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TETRA 15 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 15 non-contact AFM probe design allows for the optical viewing of the tip as it engages the...
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TETRA 16 Non-Contact AFM Probe
K-TEK Nanotechnology

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TETRA 16 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 16 non-contact probe design allows for the optical viewing of the tip as it engages the samples...
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TETRA 17 Contact AFM Probe
K-TEK Nanotechnology

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TETRA 17 AFM Mode: Contact Probe from K-TEK Nanotechnology The TETRA 17 contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing...
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TETRA 18 Non-Contact AFM Probe
K-TEK Nanotechnology

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TETRA 18 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 18 non-contact AFM probe design allows for the optical viewing of the tip as it engages the...
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TGS1 Calibration Grating Set
K-TEK Nanotechnology

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K-TEK Nano Grating set TGS1 consists of 3 calibration gratings: TGZ1, TGZ2, TGZ3 TGZ series is intended for Z-axis calibration of scanning probe microscopes (SPM) and non-linearity...
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TGS2 Calibration Grating Set
K-TEK Nanotechnology

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Grating set TGS2 consists of 6 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1 Fields of application for the TGS2 Calibration Grating Set: - Lateral and vertical calibration ...
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TGSFull Calibration Grating Full Set
K-TEK Nanotechnology

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Grating set K-TEK Nano TGSFull consists of 8 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1, TGQ1, TDG1 Fields of application for the TGSFull Calibration Grating Set: - SPM...
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AFM-Raman System

4 out of 5

Renishaw plc.

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AFM-Raman System from Renishaw - Extend your understanding of the nanoscale Renishaw has optimised direct coupling technology, making the inVia Raman microscope the perfect partner for...
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Ease of use 4 out of 5
After sales service 4 out of 5
Value for money 4 out of 5

1 review(s) of this product / read all

Bioscope Catalyst Atomic Force Microscope
VEECO Instruments Inc.

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The BioScope™ Catalyst™ Atomic Force Microscope (AFM) with ScanAsyst™ provides uncompromised high-resolution optical imaging capability and thermally limited force measurements and features...
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Dimension Edge Atomic Force Microscope System
VEECO Instruments Inc.

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The Dimension® Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance, representing a new level of productivity and attainability for the most advanced...
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Innova Scaning Probe Microscope
VEECO Instruments Inc.

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Lowest noise, highest resolution Atomic Force Microscope in its class The Innova atomic force microscope provides more performance and flexibility at a greater value than any other SPM.
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MSCT Probes

4 out of 5

VEECO Instruments Inc.

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Silicon nitride probes for contact, fluid tapping mode and force measurement, with a variety of extremely low spring constants for high force sensitivity. Sharpened; 6 cantilevers...
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Ease of use 5 out of 5
After sales service 3 out of 5
Value for money 3 out of 5

1 review(s) of this product / read all

MultiMode 8 Scanning Probe Microscope
VEECO Instruments Inc.

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MultiMode 8 Scanning Probe Microscope from Veeco Instruments The World's Highest Resolution, Most Published SPM Just Got Better The MultiMode® 8 Scanning Probe Microscope...
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AFM and Raman Imaging Combination alpha300 AR
WITec GmbH

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AFM and Raman Imaging Combination alpha300 AR - Linking chemical information with topography structures The combined AFM / Confocal Raman Imaging system WITec alpha300 AR allows the...
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