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LUMOS FT-IR Fully Automated Stand-Alone Microscope  
Bruker Optik GmbH

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LUMOS is a fully automated stand-alone FT-IR microscope. It combines best performance for visual inspection and infrared spectral analysis of micro samples with highest comfort in use. ...
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Confocal Raman and Atomic Force Microscope alpha500  
WITec GmbH

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Automated Confocal Raman and/or Atomic Force Microscope alpha500 - Automated Imaging System for Analyzing Chemical and Surface Structural Properties Acquiring hundreds of different...
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ORION NanoFab  
Carl Zeiss Microscopy

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Your 3-in-1 Multibeam Ion Microscope for Sub-10nm Nanostructuring With ORION NanoFab you profit from the only system in the world that covers the complete range of micromachining to...
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PeakForce QNM  
Bruker Daltonics

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Unprecedented quantitative characterization of materials on the nanoscale PeakForce QNM® (Quantitative Nanomechanical Property Mapping) allows quantitative nanomechanical mapping of...
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5100 Atomic Force Microscope (AFM)  

4 out of 5


Agilent Technologies

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The Agilent 5100 AFM/SPM microscope is a high-resolution system that provides excellent imaging capabilities in an easy-to-upgrade package. The 5100 offers researchers many of the same...
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  • Ease of use 4 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

5420 Atomic Force Microscope (AFM)  

5 out of 5


Agilent Technologies

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Based on the popular Agilent 5400 AFM , the 5420 has been re-engineered to provide lower noise, better performance, and greater versatility. Featuring a new ergonomic design and improved...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

5500ILM Atomic Force Microscope (AFM)  
Agilent Technologies

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The Agilent 5500 inverted light microscope (ILM) system combines the power of a high-resolution atomic force microscope with the direct optical viewing capability of an inverted optical...
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5600LS Atomic Force Microscope (AFM)  
Agilent Technologies

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Regardless of sample size, the Agilent 5600LS large-stage AFM is ready to deliver high-resolution results. The versatile 5600LS is the world’s only commercially available AFM that allows...
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Agilent 5500 Atomic Force Microscope (AFM)  

4 out of 5


Agilent Technologies

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The Agilent 5500 AFM/SPM microscope offers numerous unique features, such as patented top-down scanning and unrivalled environmental and temperature control, while providing maximum...
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  • Ease of use 3 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

5 review(s) of this product / read all

Cypher™ AFM  
Asylum Research

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Cypher™ AFM - The World's Highest Resolution AFM Asylum Research introduces the Cypher AFM, the industry’s first completely new small sample AFM/SPM in over a decade. Cypher AFM...
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MFP-3D-BIO™  

4 out of 5


Asylum Research

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MFP-3D BIO - The Only Full-Capability AFM on an Inverted Optical Microscope. Uncompromised AFM on an Inverted Optical Platform. The Asylum Research MFP-3D-BIO provides the highest...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 3 out of 5

1 review(s) of this product / read all

MFP-3D-CF™ AFM  
Asylum Research

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Asylum Research MFP-3D-CF™ - Integrated Confocal / Atomic Force Microscopy System MFP-3D-CF - Advance your bioscience research by combining the power of confocal imaging with the...
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MFP-3D™ Stand Alone AFM  

3 out of 5


Asylum Research

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Asylum Research MFP-3D™ Stand Alone AFM  - The Widest Range of AFM/SPM Capabilities Available Today The Atomic Force Microscope (AFM), has been the instrument of choice for three...
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  • Ease of use 2 out of 5
  • After sales service 4 out of 5
  • Value for money 3 out of 5

2 review(s) of this product / read all

ANPx101/NUM Positioner  
Attocube Sytems, AG

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Attocube Systems ANPx101/NUM Positioner The ANPx101/NUM Positioner with an optoelectronic encoder allows for ultra precise, closed loop positioning control. This readout solution can...
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ANPx101/RES Positioner  
Attocube Sytems, AG

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Attocube Systems ANPx101/RES The ANPx101/RES linear, horizontal stepper positioner with resistive position readout allows for absolute positioning control. This readout solution can be...
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ASC500  
Attocube Sytems, AG

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Attocube ASC500 - Scanning Probe Microscope Controller The Attocube Systems ASC500 is a modular and flexible digital SPM controller which combines state-of-the-art hardware with...
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attoAFMsolutions  
Attocube Sytems, AG

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Attocube Systems Atomic Force Microscopes (AFMs) are designed as complete system solutions, capable of being integrated into virtually any electron microscope currently on the market. ...
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attoFPSensor  
Attocube Sytems, AG

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Attocube attoFPSensor - Long range, high precision, ultra compact interferometric displacement sensor The attoFPSensor is based on a Fabry Perot interferometer consisting of a single...
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attoMFM I  
Attocube Sytems, AG

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Attocube attoMFM I - Low temperature magnetic force microscope, cantilever based The Attocube attoMFM I is a compact magnetic force microscope designed particularly for...
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attoSHPM  
Attocube Sytems, AG

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Attocube attoSHPM - Low temperature scanning Hall probe microscope The attoSHPM is a compact scanning Hall probe microscope, designed particularly for operation at low temperature and...
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BioScope Catalyst™ BioAFM  
Bruker

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The BioScope Catalyst™ BioAFM is designed specifically to best answer the unique requirements of biologists, biophysicists, and bioengineers. It combines top AFM performance with...
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Dimension Edge™ AFM platform  
Bruker-Nano

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Atomic Force Microscopy for Patterned Sapphire Substrates Delivering advanced automated metrology and production capabilities with superior resolution for now and the future. Bruker's...
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Dimension FastScan™  
Bruker-Nano

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World's Ultimate AFM The new benchmark for speed with highest resolution and performance The Dimension FastScan™ delivers, for the first time, extreme imaging speed without loss of...
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Dimension Icon Atomic Force Microscope  
Bruker-Nano

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Bringing new levels of performance, functionality, and AFM accessibility to nanoscale researchers. The Dimension Icon® Atomic Force Microscope brings new levels of performance,...
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Fluoromount-G™ 25 mL  
eBioscience

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Fluoromount-G™ is a clear liquid medium designed for use in mounting slides following immunofluorescent staining. This water-soluble Fluoromount-G™ is used to mount slides in which the...
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ICnano SICM  

3 out of 5


Ionscope Limited

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ICnano® provides a simple, robust and reliable system for scanning ion conductance microscopy (SICM) - the ideal technique for high resolution imaging of: • living cell membranes • soft...
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  • Ease of use 3 out of 5
  • After sales service 3 out of 5
  • Value for money 3 out of 5

1 review(s) of this product / read all

CSC05 AFM Mode Contact Probe  
K-TEK Nanotechnology

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CSC05 AFM Mode Contact Probe The K-TEK CSC05 “Whisker Type” AFM probe is specially designed to study deep holes, trenches, and narrow gap. With the addition of a small “whisker” at the...
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CSG01 AFM Mode Contact Probe  
K-TEK Nanotechnology

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K-TEK CSG01 AFM Mode Contact Probe This versatile CSG01 AFM Mode Contact Probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of...
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CSG10 AFM Mode Contact Probe  
K-TEK Nanotechnology

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K-TEK CSG10 AFM Mode Contact Probe This versatile CSG10 AFM Mode Contact Probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality...
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CSG11 AFM Mode Contact Probe  
K-TEK Nanotechnology

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K-TEK CSG11 AFM Mode Contact Probe This versatile CSG11 AFM Mode Contact Probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality...
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CSG30 AFM-Mode Probes  
K-TEK Nanotechnology

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K-TEK CSG30 AFM Mode Contact, Non Contact, Semi Contact Probe This versatile CSG30 contact probe provides its users with a tetrahedral tip design which allows for greater consistency...
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DCP11 Diamond Coated Probe  
K-TEK Nanotechnology

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K-TEK DCP11 Diamond Coated Probe - AFM Speciality Probe Ideal for AFM oxidation nanolithography, these conductive diamond coated probes offer a robust tip that will provide its user...
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DCP20 Diamond Coated Probe  
K-TEK Nanotechnology

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K-TEK Nano DCP20 Probe- Speciality AFM Diamond Coated Probe The Diamond Coated AFM Probe is ideal for AFM oxidation nanolithography, these conductive diamond coated probes offer a...
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DNA Test Sample  
K-TEK Nanotechnology

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K-TEK DNA Test Sample DNA01 is Plasmid pGem7zf+ (Promega), which is linearized with the SmaI endonuclease. Linear DNA molecules (3000 b. p.) are deposited at the freshly cleaved mica.
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FMG01 AFM Mode Non-Contact Force Modulation Probe  
K-TEK Nanotechnology

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K-TEK Nano FMG01 AFM Mode Non-Contact Force Modulation Probe This versatile FMG01 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater...
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HA_NC Etalon AFM Mode Contact Probe  
K-TEK Nanotechnology

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HA_NC Etalon AFM Mode Contact Probe from K-TEK Nano K-TEK Nanotechnolgy's dual cantilever Etalon probe features:   • High aspect ratio tip  • Precisely specified resonant...
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HOPG: GRAS/1.2  
K-TEK Nanotechnology

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K-TEK Nano HOPG Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects -...
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HOPG: GRAS/1.5  
K-TEK Nanotechnology

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HOPG from K-TEK Nanotechnology Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of...
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HOPG: GRBS/1.2  
K-TEK Nanotechnology

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HOPG from K-TEK Nanotechnology Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of...
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HOPG: GRBS/1.7  
K-TEK Nanotechnology

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HOPG from K-TEK Nanotechnology Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of...
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HOPG: GRBS/2.0  
K-TEK Nanotechnology

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HOPG from K-TEK Nanotechnology -HOPG ZYH Quality - Mosaic Spread: 3.5 - 5 degrees Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic...
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NSG01 AFM Mode Non-Contact Probe  
K-TEK Nanotechnology

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K-TEK Nanotechnology NSG01 - AFM Mode: Non Contact, Semi Contact Probe This versatile AFM-mode non-contact probe from K-TEK Nano provides its users with a tetrahedral tip design which...
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NSG01 DLC AFM Mode Non-Contact Probe  
K-TEK Nanotechnology

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K-TEK Nano NSG01 DLC - AFM Non-Contact Diamond-Like Carbon (DLC) Probe Super sharp diamond-like carbon (DLC) tips with typical curvature radius of 1nm are extremely useful for...
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NSG03 AFM Mode Non-Contact Probe  
K-TEK Nanotechnology

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K-TEK Nano NSG03 AFM Mode: Non Contact, Semi Contact Probe This versatile AFM mode non-contact probe provides its users with a tetrahedral tip design which allows for greater...
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NSG10 AFM Mode Non-Contact Probe  
K-TEK Nanotechnology

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K-TEK NSG10 AFM Mode: Non Contact, Semi Contact Probe This versatile non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of...
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NSG10 DLC AFM Mode Non-Contact Probe  
K-TEK Nanotechnology

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K-TEK NSG10 - Diamond Like Carbon DLC AFM Non Contact Probes Super sharp NSG10 diamond-like carbon(DLC) AFM tips with typical curvature radius of 1nm are extremely useful for...
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NSG20 AFM Mode Non-Contact Probe  
K-TEK Nanotechnology

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K-TEK Nano NSG20 - AFM Mode Non-Contact Probe This versatile NSG20 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms...
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NSG30 AFM Mode Non-Contact Probe  
K-TEK Nanotechnology

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K-TEK NSG30 - AFM Mode Non-Contact, Semi Contact Probe This versatile NSG30 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency...
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STEPP Calibration Sample  
K-TEK Nanotechnology

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STEPP calibration sample from K-TEK Nano The Silicon Test Echeloned Pattern STEPP for AFM is designed on the base of silicon (111) surface with verified distribution of monoatomic...
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TETRA 14 Non-Contact AFM Probe  
K-TEK Nanotechnology

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TETRA 14 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 14 non-contact AFM probe design allows for the optical viewing of the tip as it engages the...
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TETRA 15 Non-Contact AFM Probe  
K-TEK Nanotechnology

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TETRA 15 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 15 non-contact AFM probe design allows for the optical viewing of the tip as it engages the...
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TETRA 16 Non-Contact AFM Probe  
K-TEK Nanotechnology

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TETRA 16 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 16 non-contact probe design allows for the optical viewing of the tip as it engages the samples...
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TETRA 17 Contact AFM Probe  
K-TEK Nanotechnology

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TETRA 17 AFM Mode: Contact Probe from K-TEK Nanotechnology The TETRA 17 contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing...
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TETRA 18 Non-Contact AFM Probe  
K-TEK Nanotechnology

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TETRA 18 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 18 non-contact AFM probe design allows for the optical viewing of the tip as it engages the...
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TGS1 Calibration Grating Set  
K-TEK Nanotechnology

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K-TEK Nano Grating set TGS1 consists of 3 calibration gratings: TGZ1, TGZ2, TGZ3 TGZ series is intended for Z-axis calibration of scanning probe microscopes (SPM) and non-linearity...
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TGS2 Calibration Grating Set  
K-TEK Nanotechnology

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Grating set TGS2 consists of 6 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1 Fields of application for the TGS2 Calibration Grating Set: - Lateral and vertical calibration ...
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TGSFull Calibration Grating Full Set  
K-TEK Nanotechnology

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Grating set K-TEK Nano TGSFull consists of 8 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1, TGQ1, TDG1 Fields of application for the TGSFull Calibration Grating Set: - SPM...
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AFM-Raman System  

4 out of 5


Renishaw plc.

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AFM-Raman System from Renishaw - Extend your understanding of the nanoscale Renishaw has optimised direct coupling technology, making the inVia Raman microscope the perfect partner for...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Dimension Edge Atomic Force Microscope System  
VEECO Instruments Inc.

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The Dimension® Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance, representing a new level of productivity and attainability for the most advanced...
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Innova Scaning Probe Microscope  
VEECO Instruments Inc.

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Lowest noise, highest resolution Atomic Force Microscope in its class The Innova atomic force microscope provides more performance and flexibility at a greater value than any other SPM.
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MSCT Probes  

4 out of 5


VEECO Instruments Inc.

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Silicon nitride probes for contact, fluid tapping mode and force measurement, with a variety of extremely low spring constants for high force sensitivity. Sharpened; 6 cantilevers...
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  • Ease of use 5 out of 5
  • After sales service 3 out of 5
  • Value for money 3 out of 5

1 review(s) of this product / read all

MultiMode 8 Scanning Probe Microscope  
VEECO Instruments Inc.

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MultiMode 8 Scanning Probe Microscope from Veeco Instruments   The World's Highest Resolution, Most Published SPM Just Got Better The MultiMode® 8 Scanning Probe Microscope...
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AFM and Raman Imaging Combination alpha300 AR  
WITec GmbH

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AFM and Raman Imaging Combination alpha300 AR - Linking chemical information with topography structures The combined AFM / Confocal Raman Imaging system WITec alpha300 AR allows the...
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Atomic Force Microscope alpha300 A  
WITec GmbH

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Atomic Force Microscope alpha300 A - High-Performance User-Friendly AFM for Materials Research, Life Sciences and Nanotechnology The alpha300 A integrates an Atomic Force Microscope...
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Digital Pulsed Force Mode  
WITec GmbH

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Pulsed Force Mode (PFM) is a non-resonant, intermediate contact mode for Atomic Force Microscopy that allows the characterization of material properties such as adhesion and local...
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Scanning Near-field Optical Microscope alpha300 S  

4 out of 5


WITec GmbH

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Scanning Near-field Optical Microscope alpha300 S - Reliable and Sophisticated SNOM Imaging – Beyond the Diffraction Limit The design of the alpha300 S Scanning Near-field Optical...
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  • Ease of use 4 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Scanning Probe Microscope Series WITec alpha300  
WITec GmbH

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Scanning Probe Microscope Series WITec alpha300 The WITec microscopy series features scanning probe as well as high resolution optical and Raman microscopy techniques in either a single...
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