Scanning Probe Microscopy / Atomic Force Microscopy (SPM / AFM)

Scanning Probe Microscopy is a technique used to produce images of surfaces using mechanical probes. Types of SPM include atomic force microscopy (AFM), scanning tunneling microscopy (STM) and near field scanning optical microscopy (NSOM). There are many different types of probe / cantilever available for SPM including coated probes, diamond probes and magnetic probes.

Write a Review

Popular tags in SelectScience

Bruker BioScope Catalyst – Integrat...

Play this video

SelectScience Poll

Clinical Product Reviews Should be Anonymous




Advertisement

Advertisement

Advertisement


NGS Buying Guide Banner

Buying Guides

New Members

Proile ImageLaura Jones, Management / CEO / President / Owner, Envair Laboratory Equipment
Proile Imageyasser almawla, Laboratory Manager / Supervisor, iraqi biotech
Proile ImagePRASHANT SINGH, Research Scientist / Senior / PI, BARC
Proile ImageParamjit Kashyap, Technician, CSIR-IMTECH, Sec. 39A, Chandigarh, India

Become a Member