SPM-AFM

Scanning Probe Microscopy is a technique used to produce images of surfaces using mechanical probes. Types of SPM include atomic force microscopy (AFM), scanning tunneling microscopy (STM) and near field scanning optical microscopy (NSOM). There are many different types of probe/cantilever available for SPM including coated probes, diamond probes and magnetic probes. Learn about the latest products, user reviews, applications, news, videos and webinars.

Write a Review

Popular tags in SelectScience

Bruker BioScope Catalyst – Integrat...

Play this video

SelectScience Poll

Clinical Product Reviews Should be Anonymous




Advertisement

Advertisement

Advertisement


NGS Buying Guide Banner

Buying guides

New Members

Proile Imagetamil selvan, Product Manager, PBA SYSTEM S/B
Proile ImageMarzieh Rashedinia, Forensic Scientist / Toxicologist, private
Proile ImageBruno Rodrigues, Professor / Associate Professor, AMP
Proile ImageChen-Zhu Wang, Laboratory Director, Chinese Academy of Sciences

Become a Member