SPM-AFM
Scanning Probe Microscopy is a technique used to produce images of surfaces using mechanical probes. Types of SPM include atomic force microscopy (AFM), scanning tunneling microscopy (STM) and near field scanning optical microscopy (NSOM). There are many different types of probe/cantilever available for SPM including coated probes, diamond probes and magnetic probes. Learn about the latest products, user reviews, applications, news, videos and webinars.
Product Reviews
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- After sales service
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Peter Eaton
Membership StatusSelectScience Members can achieve membership status by writing product reviews. This helps other members to better understand the Reviewer’s experience and expertise.
| Status: | No. Reviews Published: |
| Member | 0 |
Reviewer | 1-4 |
| Advanced Reviewer | 5-14 |
| Expert Reviewer | 15+ |
| Review Panel Member | By Invitation |
Reviewers are also encouraged to publish a ‘public profile’ so others can benefit from a further understanding of the Reviewer’s applications and expertise.
Write a review today >>, Faculdade de Ciências da Universidade do Porto
- Ease of use
- After sales service
- Value for money
Andrew Stannard
Membership StatusSelectScience Members can achieve membership status by writing product reviews. This helps other members to better understand the Reviewer’s experience and expertise.
| Status: | No. Reviews Published: |
| Member | 0 |
| Reviewer | 1-4 |
| Advanced Reviewer | 5-14 |
| Expert Reviewer | 15+ |
| Review Panel Member | By Invitation |
Reviewers are also encouraged to publish a ‘public profile’ so others can benefit from a further understanding of the Reviewer’s applications and expertise.
Write a review today >>, UNIVERSITY OF NOTTINGHAM
- Ease of use
- After sales service
- Value for money
Yi Zhou
Membership StatusSelectScience Members can achieve membership status by writing product reviews. This helps other members to better understand the Reviewer’s experience and expertise.
| Status: | No. Reviews Published: |
| Member | 0 |
| Reviewer | 1-4 |
| Advanced Reviewer | 5-14 |
| Expert Reviewer | 15+ |
| Review Panel Member | By Invitation |
Reviewers are also encouraged to publish a ‘public profile’ so others can benefit from a further understanding of the Reviewer’s applications and expertise.
Write a review today >>, Indiana University--Bloomington
Latest news
News
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JPK Reports on Single Molecule Research at IISER Pune in India using AFM and CellHesion Techniques
21 May 2013
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Bruker Expands PeakForce Tapping Accessibility New Dimension Edge AFM Available with ScanAsyst
03 May 2013
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Anasys Instruments Reports on University of Illinois Publication on Nanoscale Chemical Analysis using AFM-IR
01 May 2013
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SelectScience Celebrates Queen’s Award for International Trade
26 Apr 2013
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Imec Confirms Bruker’s New Dimension Icon® SSRM-HR Atomic Force Microscope Configuration Offers Highest Resolution Carrier Profiling Capability
22 Apr 2013
Application articles
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Atomic Force Microscopy - Imaging of Cell Surfaces
WITec GmbH09 Nov 2012
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Barium Angiography in Small Animals
Bruker BioSpin14 May 2011
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Achieving High Resolution Digital Photomicrographs
JENOPTIK Optical Systems GmbH03 Nov 2010
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Flow-Injection SPR: Sensitive Determinations of Heavy Metal Ions
Biosensing Instrument22 Jan 2010
Featured products
Automated Confocal Raman and/or Atomic Force Microscope alpha500 - Automated Imaging System for Analyzing Chemical and Surface Structural Properties...
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Automated Confocal Raman and/or Atomic Force Microscope alpha500 - Automated Imaging System for Analyzing Chemical and Surface Structural Properties...
More about the Confocal Raman and Atomic Force Microscope alpha500
LUMOS is a fully automated stand-alone FT-IR microscope. It combines best performance for visual inspection and infrared spectral analysis of micro s...
More about the NEW LUMOS FT-IR Fully Automated Stand-Alone Microscope
