AFM / STM Probes

K-TEK Nanotechnology NSG01 - AFM Mode: Non Contact, Semi Contact Probe This versatile AFM-mode non-contact probe from K-TEK Nano provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality ... Read more...

K-TEK Nano NSG03 AFM Mode: Non Contact, Semi Contact Probe This versatile AFM mode non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical... Read more...

K-TEK NSG10 AFM Mode: Non Contact, Semi Contact Probe This versatile non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au ... Read more...

K-TEK Nano NSG20 - AFM Mode Non-Contact Probe This versatile NSG20 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard A... Read more...

K-TEK NSG30 - AFM Mode Non-Contact, Semi Contact Probe This versatile NSG30 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). S... Read more...

K-TEK Nano FMG01 AFM Mode Non-Contact Force Modulation Probe This versatile FMG01 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6... Read more...

K-TEK CSG01 AFM Mode Contact Probe This versatile CSG01 AFM Mode Contact Probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backsid... Read more...

K-TEK CSG10 AFM Mode Contact Probe This versatile CSG10 AFM Mode Contact Probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside... Read more...

K-TEK CSG11 AFM Mode Contact Probe This versatile CSG11 AFM Mode Contact Probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside c... Read more...

K-TEK CSG30 AFM Mode Contact, Non Contact, Semi Contact Probe This versatile CSG30 contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). St... Read more...

HA_NC Etalon AFM Mode Contact Probe from K-TEK Nano K-TEK Nanotechnolgy's dual cantilever Etalon probe features:   • High aspect ratio tip  • Precisely specified resonant frequency  • Enhanced reflection  • Economi... Read more...

K-TEK DCP11 Diamond Coated Probe - AFM Speciality Probe Ideal for AFM oxidation nanolithography, these conductive diamond coated probes offer a robust tip that will provide its user with the longevity and consistency needed. Read more...

K-TEK Nano DCP20 Probe- Speciality AFM Diamond Coated Probe The Diamond Coated AFM Probe is ideal for AFM oxidation nanolithography, these conductive diamond coated probes offer a robust tip that will provide its user with the longevi... Read more...

CSC05 AFM Mode Contact Probe The K-TEK CSC05 “Whisker Type” AFM probe is specially designed to study deep holes, trenches, and narrow gap. With the addition of a small “whisker” at the tip of the probe, users are able to investigate r... Read more...

K-TEK Nano NSG01 DLC - AFM Non-Contact Diamond-Like Carbon (DLC) Probe Super sharp diamond-like carbon (DLC) tips with typical curvature radius of 1nm are extremely useful for obtaining high resolution on objects with sizes of several... Read more...

K-TEK NSG10 - Diamond Like Carbon DLC AFM Non Contact Probes Super sharp NSG10 diamond-like carbon(DLC) AFM tips with typical curvature radius of 1nm are extremely useful for obtaining high resolution on objects with sizes o... Read more...

TETRA 14 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 14 non-contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targe... Read more...

TETRA 15 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 15 non-contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targe... Read more...

TETRA 16 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 16 non-contact probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting... Read more...

TETRA 17 AFM Mode: Contact Probe from K-TEK Nanotechnology The TETRA 17 contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting ability. Combin... Read more...

TETRA 18 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 18 non-contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior ta... Read more...

Silicon nitride probes for contact, fluid tapping mode and force measurement, with a variety of extremely low spring constants for high force sensitivity. Sharpened; 6 cantilevers 0.01-0.50N/m; Au Reflective Coating. Tip Specification ... Read more...