Scanning Probe Microscopy / Atomic Force Microscopy(SPM-AFM) Scanning Probe Microscopy / Atomic Force Microscopy(SPM-AFM) Products, Reviews and Suppliers on SelectScience

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Read user reviews, compare products and contact manufacturers of Scanning Probe Microscopy / Atomic Force Microscopy(SPM-AFM) products on SelectScience.

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Atomic Force Microscopy (AFM) Microscopes/Systems (20)

Automated Microscopes/Systems (4)

Combined AFM Microscopes/Systems (5)

Environmental Control Microscopes/Systems (1)

Magnetic Force Microscopy (MFM) Microscopes/Systems (2)

Multimode Microscopes/Systems (1)

Near-field Scanning Optical Microscopy (NSOM /SNOM) Microscopes/Systems (2)

Scanning Hall Probe Microscopes (SHPM)/Systems (1)

Scanning Probe Microscopes (SPM)/Systems (5)

SPM/AFM Accessories (26)

SPM/AFM Cantilevers / Levers (20)

SPM/AFM Positioners / Nanopositioners (3)

SPM/AFM Probes (23)

SPM/AFM Software (1)

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Atomic Force Microscope alpha300 A
WITec GmbH

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Atomic Force Microscope alpha300 A - High-Performance User-Friendly AFM for Materials Research, Life Sciences and Nanotechnology The alpha300 A integrates an Atomic Force Microscope...
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Digital Pulsed Force Mode
WITec GmbH

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Pulsed Force Mode (PFM) is a non-resonant, intermediate contact mode for Atomic Force Microscopy that allows the characterization of material properties such as adhesion and local...
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Scanning Near-field Optical Microscope alpha300 S

4 out of 5

WITec GmbH

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Scanning Near-field Optical Microscope alpha300 S - Reliable and Sophisticated SNOM Imaging – Beyond the Diffraction Limit The design of the alpha300 S Scanning Near-field Optical...
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Ease of use 4 out of 5
After sales service 3 out of 5
Value for money 4 out of 5

1 review(s) of this product / read all

Scanning Probe Microscope Series WITec alpha300
WITec GmbH

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Scanning Probe Microscope Series WITec alpha300 The WITec microscopy series features scanning probe as well as high resolution optical and Raman microscopy techniques in either a single...
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