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TETRA 14 Non-Contact AFM Probe  
K-TEK Nanotechnology

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TETRA 14 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 14 non-contact AFM probe design allows for the optical viewing of the tip as it engages the...
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TETRA 15 Non-Contact AFM Probe  
K-TEK Nanotechnology

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TETRA 15 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 15 non-contact AFM probe design allows for the optical viewing of the tip as it engages the...
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TETRA 16 Non-Contact AFM Probe  
K-TEK Nanotechnology

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TETRA 16 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 16 non-contact probe design allows for the optical viewing of the tip as it engages the samples...
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TETRA 17 Contact AFM Probe  
K-TEK Nanotechnology

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TETRA 17 AFM Mode: Contact Probe from K-TEK Nanotechnology The TETRA 17 contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing...
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TETRA 18 Non-Contact AFM Probe  
K-TEK Nanotechnology

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TETRA 18 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 18 non-contact AFM probe design allows for the optical viewing of the tip as it engages the...
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TGS1 Calibration Grating Set  
K-TEK Nanotechnology

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K-TEK Nano Grating set TGS1 consists of 3 calibration gratings: TGZ1, TGZ2, TGZ3 TGZ series is intended for Z-axis calibration of scanning probe microscopes (SPM) and non-linearity...
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TGS2 Calibration Grating Set  
K-TEK Nanotechnology

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Grating set TGS2 consists of 6 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1 Fields of application for the TGS2 Calibration Grating Set: - Lateral and vertical calibration ...
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TGSFull Calibration Grating Full Set  
K-TEK Nanotechnology

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Grating set K-TEK Nano TGSFull consists of 8 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1, TGQ1, TDG1 Fields of application for the TGSFull Calibration Grating Set: - SPM...
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AFM-Raman System  

4 out of 5


Renishaw plc.

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AFM-Raman System from Renishaw - Extend your understanding of the nanoscale Renishaw has optimised direct coupling technology, making the inVia Raman microscope the perfect partner for...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Dimension Edge Atomic Force Microscope System  
VEECO Instruments Inc.

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The Dimension® Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance, representing a new level of productivity and attainability for the most advanced...
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Innova Scaning Probe Microscope  
VEECO Instruments Inc.

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Lowest noise, highest resolution Atomic Force Microscope in its class The Innova atomic force microscope provides more performance and flexibility at a greater value than any other SPM.
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MSCT Probes  

4 out of 5


VEECO Instruments Inc.

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Silicon nitride probes for contact, fluid tapping mode and force measurement, with a variety of extremely low spring constants for high force sensitivity. Sharpened; 6 cantilevers...
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  • Ease of use 5 out of 5
  • After sales service 3 out of 5
  • Value for money 3 out of 5

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MultiMode 8 Scanning Probe Microscope  
VEECO Instruments Inc.

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MultiMode 8 Scanning Probe Microscope from Veeco Instruments   The World's Highest Resolution, Most Published SPM Just Got Better The MultiMode® 8 Scanning Probe Microscope...
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AFM and Raman Imaging Combination alpha300 AR  
WITec GmbH

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AFM and Raman Imaging Combination alpha300 AR - Linking chemical information with topography structures The combined AFM / Confocal Raman Imaging system WITec alpha300 AR allows the...
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Atomic Force Microscope alpha300 A  
WITec GmbH

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Atomic Force Microscope alpha300 A - High-Performance User-Friendly AFM for Materials Research, Life Sciences and Nanotechnology The alpha300 A integrates an Atomic Force Microscope...
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Digital Pulsed Force Mode  
WITec GmbH

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Pulsed Force Mode (PFM) is a non-resonant, intermediate contact mode for Atomic Force Microscopy that allows the characterization of material properties such as adhesion and local...
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Scanning Near-field Optical Microscope alpha300 S  

4 out of 5


WITec GmbH

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Scanning Near-field Optical Microscope alpha300 S - Reliable and Sophisticated SNOM Imaging – Beyond the Diffraction Limit The design of the alpha300 S Scanning Near-field Optical...
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  • Ease of use 4 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

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Scanning Probe Microscope Series WITec alpha300  
WITec GmbH

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Scanning Probe Microscope Series WITec alpha300 The WITec microscopy series features scanning probe as well as high resolution optical and Raman microscopy techniques in either a single...
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