AFM Calibration Standards

K-TEK Nano Grating set TGS1 consists of 3 calibration gratings: TGZ1, TGZ2, TGZ3 TGZ series is intended for Z-axis calibration of scanning probe microscopes (SPM) and non-linearity measurements. Each grating offers a different step hei... Read more...

Grating set TGS2 consists of 6 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1 Fields of application for the TGS2 Calibration Grating Set: - Lateral and vertical calibration - Detection of lateral non-linearity - Detection... Read more...

Grating set K-TEK Nano TGSFull consists of 8 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1, TGQ1, TDG1 Fields of application for the TGSFull Calibration Grating Set: - SPM simultaneous calibration of X, Y, and Z directions... Read more...

STEPP calibration sample from K-TEK Nano The Silicon Test Echeloned Pattern STEPP for AFM is designed on the base of silicon (111) surface with verified distribution of monoatomic steps as main calibrating inits for the complex contr... Read more...