3D Surface Profiler

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Dektak® 8 Advanced Development Profiler  

3 out of 5

The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and...
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  • Ease of use 4 out of 5
  • After sales service 2 out of 5
  • Value for money 4 out of 5

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TrueSurface Microscopy  

True Surface Microscopy - Confocal Microscopy Along with Large Area Optical Profiling WITec´s new True Surface Microscopy option (patent pending) allows confocal Raman imaging guided...
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