Profilometers
Profilometers are instruments used to measure a surface's profile, in order to quantify etch depth, deposited film thickness, and surface roughness. They operate in either contact or non-contact modes and may use optical or stylus techniques to make the actual measurements. Learn about the latest products, user reviews, application articles, news, videos and webinars.
Product Reviews
- Ease of use
- After sales service
- Value for money
"this is a very flexible instrument, but we find there are some software constraints."
Klaus Heinzinger
‘Membership Status’ indicates whether this member is an active reviewer on the site, and how many reviews have been published.| Status: | No. Reviews Published: |
| Member | 0 |
Reviewer | 1-4 |
| Advanced Reviewer | 5-14 |
| Expert Reviewer | 15+ |
To be seen as an authority on SelectScience, find your products to review today., PNSensor GmbH
Latest news
News
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Nano-Positioning Stage for 3D Laser Lithography
17 Apr 2012
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Non-contact Multilayer Film Thickness Measurement
29 Sep 2011
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Small Spot Film Thickness, UV Microscopy and Raman Microspectroscopy of Large Scale Devices- The 20/20 XL™ from CRAIC Technologies
06 Jul 2011
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Uniscan Instruments Introduce a New Cell for Topographic Measurements
30 Mar 2011
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WITec Introduces True Surface Microscopy
18 Mar 2011
Application articles
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