Profilometers
Profilometers are instruments used to measure a surface's profile, in order to quantify etch depth, deposited film thickness, and surface roughness. They operate in either contact or non-contact modes and may use optical or stylus techniques to make the actual measurements. Learn about the latest products, user reviews, applications, news, videos and webinars.
Product Reviews
- Ease of use
- After sales service
- Value for money
"this is a very flexible instrument, but we find there are some software constraints."
Klaus Heinzinger
Membership StatusSelectScience Members can achieve membership status by writing product reviews. This helps other members to better understand the Reviewer’s experience and expertise.
| Status: | No. Reviews Published: |
| Member | 0 |
Reviewer | 1-4 |
| Advanced Reviewer | 5-14 |
| Expert Reviewer | 15+ |
| Review Panel Member | By Invitation |
Reviewers are also encouraged to publish a ‘public profile’ so others can benefit from a further understanding of the Reviewer’s applications and expertise.
Write a review today >>, PNSensor GmbH
Latest news
News
-
Laser Physics Introduces the New Polarcam from 4D Technology
11 Dec 2012
-
Nano-Positioning Stage for 3D Laser Lithography
17 Apr 2012
-
Non-contact Multilayer Film Thickness Measurement
29 Sep 2011
-
Small Spot Film Thickness, UV Microscopy and Raman Microspectroscopy of Large Scale Devices- The 20/20 XL™ from CRAIC Technologies
06 Jul 2011
-
Uniscan Instruments Introduce a New Cell for Topographic Measurements
30 Mar 2011
Application articles
Featured products
PolarCam micropolarizer cameras simultaneously capture multiple polarized images of each video frame, enabling a range of image enhancement techniq...
More about the PolarCam
Popular tags in SelectScience
