ZEISS ZEMAS by ZEISS Research Microscopy Solutions
Manufacturer ZEISS Research Microscopy Solutions
ZEISS Electron Microscopy Application Software for TEM With ZEMAS software you easily acquire and analyse data with ZEISS LIBRA series transmission electron microscopes. Profit from an experiment driven workflow interface including the complete system integration of all TEM components. Data handling, processing and archiving is built on a database architecture providing a solid base for multi-user, high-throughput instrument usage. Conduct your routine and advanced TEM/STEM nano-characterization... Read more
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ZEISS ZEMAS
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ZEISS Electron Microscopy Application Software for TEM
With ZEMAS software you easily acquire and analyse data with ZEISS LIBRA series transmission electron microscopes. Profit from an experiment driven workflow interface including the complete system integration of all TEM components. Data handling, processing and archiving is built on a database architecture providing a solid base for multi-user, high-throughput instrument usage. Conduct your routine and advanced TEM/STEM nano-characterization experiments easily.
The ZEMAS software consists of two software applications: use Data Collection to perform experiments and control your TEM while acquiring data from a variety of detectors. With Data Viewer you view and analyse your data collected with Data Collection.
Profit from the broad functionality of your TEM with regards to imaging, advanced spectroscopy and spectrum imaging, diffraction and automated tomography.
With ZEMAS software you easily acquire and analyse data with ZEISS LIBRA series transmission electron microscopes. Profit from an experiment driven workflow interface including the complete system integration of all TEM components. Data handling, processing and archiving is built on a database architecture providing a solid base for multi-user, high-throughput instrument usage. Conduct your routine and advanced TEM/STEM nano-characterization experiments easily.
The ZEMAS software consists of two software applications: use Data Collection to perform experiments and control your TEM while acquiring data from a variety of detectors. With Data Viewer you view and analyse your data collected with Data Collection.
Profit from the broad functionality of your TEM with regards to imaging, advanced spectroscopy and spectrum imaging, diffraction and automated tomography.
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