ZEISS Xradia 520 Versa by ZEISS Research Microscopy Solutions
Status:
Reviewer
Member since: 2018
Organization: Arizona State University
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- Ease of use
- After sales service
- Value for money
Indispensable non-destructive imaging tool
Application Area: Analyze materials non-destructively with sub-micron resolution
"Highly recommended tool for non-destructive analyses of a wide variety of materials in both physical and biological sciences. Sub-micron resolution allows for nanoscale analysis. Softwares such as ATLAS allow for correlative applications with electron microscopy. DCT add-on recommended for 3D grain orientation studies of materials."
Review date: 07 Aug 2018 | ZEISS Xradia 520 Versa
Status:
Reviewer Member since: 2018
Organization: ASU
-
- Ease of use
- After sales service
- Value for money
Great quality of scans. Love the recipe options and wide variety of capabilities.
Application Area:Tomography of a variety of specimen, biological and non-biological
"Scan quality is brilliant. Recipe options help run many scans on the same specimen one after the other. Diffraction contrast tonight is still in a rudimentary stage but is poised to improve over time."
Review date: 07 Aug 2018 | ZEISS Xradia 520 Versa
Unlock new degrees of versatility for your scientific discovery and industrial research with the ZEISS Xradia 520 Versa 3D X-ray microscope.
Building on industry-best resolution and contrast, Xradia 520 Versa expands the boundaries of non-destructive imaging for breakthrough flexibility and discernment critical to your research. Innovative contrast and acquisition techniques free you to seek—and find—what you've never seen before. Move beyond exploration and achieve discovery.
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Product Overview
ZEISS Xradia 520 Versa
Manufacturer ZEISS Research Microscopy Solutions | Available Worldwide
4.7 / 5.0 | 2 reviews
