ZEISS Crossbeam FIB-SEM by ZEISS Research Microscopy Solutions
Manufacturer ZEISS Research Microscopy Solutions
Speed up your tomography runs: use up to 100 nA FIB current with excellent spot profile to bridge the gap between micro- and nanopatterning.
With Crossbeam you combine the imaging and analytical performance of the GEMINI column with the ability of a next-generation FIB for material processing and sample preparation on a nanoscopic scale. Use the modular platform concept and the open and easily extendable software architecture of this 3D nano-workstation for high throughput nanotomography and na... Read more
ZEISS Crossbeam FIB-SEM
Speed up your tomography runs: use up to 100 nA FIB current with excellent spot profile to bridge the gap between micro- and nanopatterning.
With Crossbeam you combine the imaging and analytical performance of the GEMINI column with the ability of a next-generation FIB for material processing and sample preparation on a nanoscopic scale. Use the modular platform concept and the open and easily extendable software architecture of this 3D nano-workstation for high throughput nanotomography and nanofabrication of even your most demanding, charging or magnetic samples.
Features & Benefits:
With Crossbeam you combine the imaging and analytical performance of the GEMINI column with the ability of a next-generation FIB for material processing and sample preparation on a nanoscopic scale. Use the modular platform concept and the open and easily extendable software architecture of this 3D nano-workstation for high throughput nanotomography and nanofabrication of even your most demanding, charging or magnetic samples.
Features & Benefits:
- Speed up your nanotomography and nanofabrication: combine low kV SEM performance with FIB currents up to 100 nA.
- Gain maximum information: use multi-detector acquisition and the ability to mill and image simultaneously.
- Examine large fields of view of up to 50 k x 40 k pixels - thanks to GEMINI technology and the optional ATLAS 3D package.
- Profit from maximum stability and a uniform beam profile during your demanding long-term experiments.
- Change system parameters such as probe current or acceleration voltage in real time during your acquisition, without image adjustments.
- Enjoy the easy-to-understand graphical user interface.
- Easily upgrade your Crossbeam with a wide range of detectors and accessories.
- Customize your system for in situ experiments.
- With the open application programming interface (API) you have access to every microscope parameter.
Product Overview
ZEISS Crossbeam FIB-SEM
Manufacturer ZEISS Research Microscopy Solutions
Be the first to review this product
