PANalytical's X'Pert PRO Materials Research Diffractometer is the most flexible system available for X-ray diffraction studies for: • Advanced materials science and nanotechnology • Metrologic characterization in semiconductor process development It can handle a wide range of applications, and is especially suitable for thin film analysis applications such as: • Rocking curve analysis and reciprocal space mapping • Reflectometry and thin film phase analysis • Residual stress and texture analysis As well as the proven standard version of the Panalytical XPert PRO MRD system, a number of special versions exist: • With the XPert PRO MRD system for in-plane diffraction, it becomes possible to measure diffraction from lattice planes that are perpendicular to the sample surface • The X'Pert PRO...Read more
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Member since: 2010
Organization: Zhejiang University of Technology