PANalytical's X'Pert PRO Materials Research Diffractometer is the most flexible system available for X-ray diffraction studies for: • Advanced materials science and nanotechnology • Metrologic characterization in semiconductor process development It can handle a wide range of applications, and is especially suitable for thin film analysis applications such as: • Rocking curve analysis and reciprocal space mapping • Reflectometry and thin film phase analysis • Residual stress and texture analysis As well as the proven standard version of the Panalytical XPert PRO MRD system, a number of special versions exist: • With the XPert PRO MRD system for in-plane diffraction, it becomes possible to measure diffraction from lattice planes that are perpendicular to the sample surface • The X'Pert PRO...Read more
Receive your quote directly from PANalytical Inc..
SelectScience Members can achieve membership status by writing product reviews. This helps other members to better understand the Reviewer's experience and expertise.
Status: No. Reviews Published: Member 0 1-4 5-14 15+ By Invitation
Reviewers are also encouraged to publish a 'public profile' so others can benefit from a further understanding of the Reviewer's applications and expertise.
Write a review today>>
Reviewer(what's this)Membership Status
Member since: 2010
Organization: Zhejiang University of Technology