X'Pert3 MRD by PANalytical Inc.

Manufacturer PANalytical Inc.  |  Available Worldwide
4.3
/
5.0
  |  1 reviews


X'Pert3 MRD by PANalytical Inc. product image
X'Pert3 MRD
Request Pricing

Receive your quote directly from the manufacturer.




Average Rating: 4.3
1 Scientist has reviewed this product

5 out of 5
Ease of use
5 out of 5
After sales service
3 out of 5
Value for money

PANalytical's X'Pert3 Materials Research Diffractometer is the most flexible system available for X-ray diffraction studies for:

  • Advanced materials science and nanotechnology
  • Metrologic characterization in semiconductor process development

It can handle a wide range of applications, and is especially suitable for thin film analysis applications such as:

  • Rocking curve analysis and reciprocal space mapping
  • Reflectometry and thin film phase analysis
  • Residual stress and texture analysis

As well as the proven standard version of the Panalytical XPert3 MRD system, a number of special versions exist:

  • With the XPert3 MRD system for in-plane diffraction, it becomes possible to measure diffraction from lattice planes that are perpendicular to the sample surface
  • The X'Pert3 Extended MRD allows mounting of an X-ray mirror and a high-resolution monochromator in-line, increasing the intensity of the incident beam
  • The X'Pert 3 MRD XL meets all the high-resolution XRD analysis requirements of the semiconductors, thin films, and advanced materials industries
  • By facilitating analysis of wafers up to 300 mm in diameter, with a sophisticated, automatic wafer loader option, the X'Pert3 MRD XL becomes an advanced tool for thin film process development

Product Overview

X'Pert3 MRD by PANalytical Inc. product image

X'Pert3 MRD

Manufacturer PANalytical Inc.  |  Available Worldwide

4.3 / 5.0 | 1 reviews