X'Pert PRO MRD

PANalytical's X'Pert PRO Materials Research Diffractometer is the most flexible system available for X-ray diffraction studies for: • Advanced materials science and nanotechnology • Metrologic characterization in semiconductor process development It can handle a wide range of applications, and is especially suitable for thin film analysis applications such as: • Rocking curve analysis and reciprocal space mapping • Reflectometry and thin film phase analysis • Residual stress and texture analysis As well as the proven standard version of the Panalytical XPert PRO MRD system, a number of special versions exist: • With the XPert PRO MRD system for in-plane diffraction, it becomes possible to measure diffraction from lattice planes that are perpendicular to the sample surface • The X'Pert PRO...Read more

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Reviews

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Average Rating: 4.3

Ease of use
5 out of 5
After sales service
5 out of 5
Value for money
3 out of 5
Rating: 4.3
Ease of use
5 out of 5
After sales service
5 out of 5
Value for money
3 out of 5
  • Review date: 16 May 2012

  • X'Pert PRO MRD

"instrument gives excellent accuracy and is of good quality.Good intensity and rapid performance. It is easy to operate."

Description

PANalytical's X'Pert PRO Materials Research Diffractometer is the most flexible system available for X-ray diffraction studies for:
• Advanced materials science and nanotechnology
• Metrologic characterization in semiconductor process development

It can handle a wide range of applications, and is especially suitable for thin film analysis applications such as:
• Rocking curve analysis and reciprocal space mapping
• Reflectometry and thin film phase analysis
• Residual stress and texture analysis

As well as the proven standard version of the Panalytical XPert PRO MRD system, a number of special versions exist:
• With the XPert PRO MRD system for in-plane diffraction, it becomes possible to measure diffraction from lattice planes that are perpendicular to the sample surface
• The X'Pert PRO Extended MRD allows mounting of an X-ray mirror and a high-resolution monochromator in-line, increasing the intensity of the incident beam
• The X'Pert PRO MRD XL meets all the high-resolution XRD analysis requirements of the semiconductors, thin films, and advanced materials industries
• By facilitating analysis of wafers up to 300 mm in diameter, with a sophisticated, automatic wafer loader option, the X'Pert PRO MRD XL becomes an advanced tool for thin film process development

Product Overview

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X'Pert PRO MRD

by PANalytical Inc.

4.3/5.0 (1 reviews)
Ease of use
5 out of 5
After sales service
5 out of 5
Value for money
3 out of 5






Receive your quote directly from PANalytical Inc. for X'Pert PRO MRD