WITec Suite Software by Oxford Instruments WITec
Manufacturer Oxford Instruments WITec
WITec Suite is a powerful software for data acquisition, evaluation, and processing of even large data volumes and 3D scans.
The software architecture enables an integrated and consolidated functionality incorporating the various WITec techniques and measurement modes such as Raman, AFM, SNOM, Raman-AFM, Raman-SEM, fluorescence and combinations thereof.The software provides both a clear and intuitive user interface combined with a variety of features and functions for the most sophisticated dat... Read more
WITec Suite Software
WITec Suite is a powerful software for data acquisition, evaluation, and processing of even large data volumes and 3D scans.
The software architecture enables an integrated and consolidated functionality incorporating the various WITec techniques and measurement modes such as Raman, AFM, SNOM, Raman-AFM, Raman-SEM, fluorescence and combinations thereof.
The software provides both a clear and intuitive user interface combined with a variety of features and functions for the most sophisticated data analysis on the market.
Features:
The software architecture enables an integrated and consolidated functionality incorporating the various WITec techniques and measurement modes such as Raman, AFM, SNOM, Raman-AFM, Raman-SEM, fluorescence and combinations thereof.
The software provides both a clear and intuitive user interface combined with a variety of features and functions for the most sophisticated data analysis on the market.
Features:
- High-speed data acquisition and processing through intelligent computer resource management (i.e. > 1300 Raman spectra per second)
- Large data acquisition volumes per measurement (i.e. several million pixels per image, e.g. Raman spectra, PFM-curves)
- User-friendly software interface with smart access options for all principal functions (e.g. circle mouse menu, drag-and-drop actions)
- Accelerated workflow through intuitive menu guidance
- Overlay of images from different measurements e.g. overlay of AFM/TrueSurface topography with chemical Raman information
- Advanced image post-processing functions for e.g. 3D imaging and volume visualizations
- Help option for quick and easy problem solving
Product Overview
