Verios (XHR) - Scanning Electron Microscope by FEI Company
Manufacturer FEI Company
The Verios is the second generation of FEI’s leading XHR (extreme high resolution) SEM family.
It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
The supplier does not provide quotations for this product through SelectScience. Browse these related products instead
Verios (XHR) - Scanning Electron Microscope
The Verios is the second generation of FEI’s leading XHR (extreme high resolution) SEM family.
It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
Product Overview
Verios (XHR) - Scanning Electron Microscope
Manufacturer FEI Company
Be the first to review this product