UVISEL Plus Spectroscopic Ellipsometer by HORIBA Scientific
Manufacturer HORIBA Scientific
The Reference Ellipsometer for Thin Film Measurements
The UVISEL Plus ellipsometer range offers the best combination of modularity and performance for advanced thin film, surface and interface characterization.
The new UVISEL Plus includes the newest acquisition technology designed to measure faster and more accurately than ever. FastAcq, the newest acquisition technology, is based on double modulation, designed for real world thin film characterization.
UVISEL Plus Spectroscopic Ellipsometer
Average Rating: 4.7
1 Scientist has reviewed this product
Status:
Expert Reviewer
Member since: 2020
Organization: A D Patel Institute of Technology
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- Ease of use
- After sales service
- Value for money
Good product! Reproducible data achieved every time.
Rating: 4.7
Application Area: Semiconductors
"This product is low efforts and you can save your time while getting your results. Advanced features are embedded in this product. Optical gain is also very good."
Review date: 10 Feb 2021 | UVISEL Plus Spectroscopic Ellipsometer
The Reference Ellipsometer for Thin Film Measurements
The UVISEL Plus ellipsometer range offers the best combination of modularity and performance for advanced thin film, surface and interface characterization.
The new UVISEL Plus includes the newest acquisition technology designed to measure faster and more accurately than ever. FastAcq, the newest acquisition technology, is based on double modulation, designed for real world thin film characterization.
Product Overview
