UVISEL Plus Spectroscopic Ellipsometer by HORIBA Scientific

Manufacturer HORIBA Scientific
The Reference Ellipsometer for Thin Film Measurements The UVISEL Plus ellipsometer range offers the best combination of modularity and performance for advanced thin film, surface and interface characterization. The new UVISEL Plus includes the newest acquisition technology designed to measure faster and more accurately than ever. FastAcq, the newest acquisition technology, is based on double modulation, designed for real world thin film characterization.


UVISEL Plus Spectroscopic Ellipsometer by HORIBA Scientific product image
UVISEL Plus Spectroscopic Ellipsometer
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The Reference Ellipsometer for Thin Film Measurements

The UVISEL Plus ellipsometer range offers the best combination of modularity and performance for advanced thin film, surface and interface characterization.
The new UVISEL Plus includes the newest acquisition technology designed to measure faster and more accurately than ever. FastAcq, the newest acquisition technology, is based on double modulation, designed for real world thin film characterization.